CMOS RF Circuit Design for Reliability and Variability

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

List of contents

CMOS Transistor Reliability and Variability.- Wireless Receiver and Transmitter Circuit Reliability.- Low Noise Amplifier Reliability and Variability.- Power Amplifier Reliability and Variability.- Voltage Controlled Oscillator Reliability and Variability.- Mixer Reliability.

Summary

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

Product details

• Authors: Jiann-Shiun Yuan
• Publisher: Springer, Berlin
• Languages: English
• Product format: Paperback / Softback
• Released: 30.06.2016
• EAN: 9789811008825
• ISBN: 978-981-10-0882-5
• No. of pages: 106
• Dimensions: 168 mm x 235 mm x 6 mm
• Weight: 188 g
• Illustrations: VI, 106 p. 101 illus.
• Series: SpringerBriefs in Applied Sciences and Technology; SpringerBriefs in Reliability; SpringerBriefs in Applied Sciences and Technology; SpringerBriefs in Reliability
• Subjects: Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering; C, engineering, Microwaves, RF and Optical Engineering, Microwaves, RF Engineering and Optical Communications, Circuits and Systems, Electronic Circuits and Devices, Electronic devices & materials, Electronic circuits, Electronic Circuits and Systems, Electronics: circuits & components, Optical engineering, Microwaves, Microwave technology