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Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
About the author
Dr. Zhiping Luo is an associate professor in the department of chemistry and physics at Fayetteville State University, North Carolina. He started electron microscopy in early 1990s. While he was conducting his PhD thesis work on rare earths-containing magnesium alloys, he encountered with fine complex intermetallic phases, so he used TEM as a major research method. From 1996 to 1997 he was at Okayama University of Science, Japan as a postdoctoral researcher to study electron microscopy with Professor H. Hashimoto. In 1998, he moved to materials science division, Argonne National Laboratory, as a visiting scholar and became the assistant scientist in 2001. Between 2001 and 2012, he worked as a TEM instrumental scientist at the Microscopy and Imaging Center at Texas A&M University, where he taught TEM courses and trained many TEM users. Dr. Luo has authored over 200 articles in peer-reviewed journals, and most of them involved TEM investigations.
