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Adopting a groundbreaking approach, the highly regarded author shows how to design methods for planning increasingly complex experiments. He begins with a brief introduction to standard quality methods and the technology in standard electric circuits. The book then gives numerous examples of how to apply the proposed methodology in a series of real-life case studies. Although these case studies are taken from the printed circuit board industry, the methods are equally applicable to other fields of engineering.
List of contents
PART I: IntroductionPRINTED CIRCUITSTechnology PresentationInner-Layer ProcessingMaterials PreparationLaminationDrillingMaking the Hole ConductiveImagingElectroplatingCopper EtchingSolder MaskingSurface FinishingRoutingTesting and InspectionAssemblingPROBLEM SOLVING FOR RELIABILITY AND QUALITYConventional ParadigmsComplexity and Time FramesQuasilinearity, Circularity, and ClosureAdvance of Reliability ParadigmsPART II: Evolvable Designs of Experiments (EDOE)POLYSTOCHASTIC MODELSWhat is PSM?Basic Notions for Categorical FrameIllustrative Examples of PSM and Categorical FramesFIRST-ORDER WAVE EQUATIONAlgebraic Frames for Time "T" and Space "Z"The First-Order Wave Equation"Kinetic" Model: Walsh-Hadamard Matrices"Convection" Model: Latin SquaresSpectral Analysis: CorrelationINFORMATIONAL ANALYSIS: EDOE MATRICESWalsh-Hadamard Matrices and Latin Square DesignsClassification Procedures: Informational CriteriaInformational Entropy and DistancesAdaptability in ClassificationInformational ResultsRelation with ThermodynamicsRanking, Discarding, and Replication of the ColumnsLumping and Splitting ColumnsJuxtaposing and CuttingTables of DOE MatricesEDOE METHODOLOGYScientific and Engineering MethodsCenter Design and HierarchyRecursivity and FocusingProblem-Solving Framework for PCB QualityForward and Backward SearchInteractions: Dissociation - IntegrationEDOE Basic StepsEDOE Frame and SKUP SchemaComparison of EDOE with other MethodsPART III: Case StudiesSOLDER WICKINGIllustrative Failure AnalysisIllustrative EDOE FrameSKUP Schema for Solder WickingRELIABILITY ANALYSISEDOE for ReliabilitySKUP Schema for ReliabilityReliability Management Systems: Main ElementsReliability Prediction SoftwareMinicouponsReliability AnalysisIST Electrical Resistance AnalysisDRILLINGDrilling Quality FrameworkTest CouponsTesting Small Plated Through Holes: SKUP Schema for DrillingReliability TestsLifetime MapsDrilling Quality EvaluationsTesting the Design, DTesting for Processing, PReliability EvaluationsSURFACE FINISH SOLDERABILITYFinish Solderability FrameSKUP Schema for Surface FinishDIRECT PLATEDirect Plate ReliabilityMicrosectioning ResultsElectrical Resistance versus the Number of Cycles Classification MethodAssociated Vectors-GridsFirst Step of ClassificationSecond Step of ClassificationIST Lifetime and Electroplated Cu ThicknessSummarySKUP Schema for Direct PlatePLATING VOIDSPlating Voids TypeThe SKUP Schema for Plating VoidsPART IV: EvolvabilitySELF-ADAPTIVE CIRCUITSEvolvability LevelsSelf-AdaptivitySelf-Adaptive Designs and ConstructionsSelf-Adaptive MaterialsSelf-Adaptive ProcessingSelf-Adaptability to Testing and Field ConditionsPROACTIVE CIRCUITSProactiveness for CircuitEvolutionary HardwareElectrochemical Filament CircuitsEVOLVABLE CIRCUITSEvolvability ChallengesMolecular ElectronicsBacteriorhodopsin for Optoelectronic CircuitryEmbedded Symbolic-Connectionists HybridsTemporal Synchrony for Embedded Symbolic-Connectionist HybridsEmbedded EDOEHybrid Controlled Microfluidic CircuitsReconfigurable Microfluidic CircuitsSelf-Constructed Molecular Circuits and ComputingGenetic Code-Like Mechanism for Molecular CircuitryConventional Circuits versus Evolvable CircuitsEVOLVABLE MANUFACTURING SYSTEMSManufacturing ParadigmsFractal Manufacturing SystemHolonic Manufacturing SystemBiologic Manufacturing SystemVirtual Manufacturing SystemSKUP Schema for Virtual Manufacturing SystemsMultiagent Manufacturing Systems: ArchitectureMuiltiagent-Based Versus Conventional Manufacturing SystemsPART V: Concluding RemarksRELATED CONCEPTSComplexityEvolvabilityPolystochastic MethodConstructivismCybernetics and the Cycle of Sciences
About the author
Octavian Iordache obtained his PhD in chemical engineering from the Polytechnic Institute of Bucharest and a diploma in mathematics from the University of Bucharest. He was a professor of chemical engineering and has conducted research at several universities in Europe and North America. He is with a Montreal-based start up company involved with Research, Development, Test and Evaluation (RDT&E) activities. His research and teaching pertains to the domains of transport phenomena, chemical reaction engineering, material science, stochastic processes and statistics. He has authored 8 books and over 100 papers.
Summary
Adopting a groundbreaking approach, the highly regarded author shows how to design methods for planning increasingly complex experiments.
He begins with a brief introduction to standard quality methods and the technology in standard electric circuits. The book then gives numerous examples of how to apply the proposed methodology in a series of real-life case studies. Although these case studies are taken from the printed circuit board industry, the methods are equally applicable to other fields of engineering.
