Fr. 152.40

C S Barrett, Charles S Barrett, Charles S. Barrett, J V Gilfrich, J. V. Gilfrich, John V Gilfrich...

Advances in X-Ray Analysis - Volume 35B

English · Hardback

Shipping usually within 3 to 5 weeks (title will be specially ordered)

Description

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

List of contents

Product details

Assisted by	C S Barrett (Editor), Charles S Barrett (Editor), Charles S. Barrett (Editor), J V Gilfrich (Editor), J. V. Gilfrich (Editor), John V Gilfrich (Editor), John V. Gilfrich (Editor), T C Huang (Editor), T. C. Huang (Editor), Ting C Huang (Editor), Ting C. Huang (Editor), Ron Jenkins (Editor), G J McCarthy (Editor), G. J. McCarthy (Editor), Paul K Predecki (Editor), Paul K. Predecki (Editor), R. Ryon (Editor), Deane K Smith (Editor), Deane K. Smith (Editor)
Publisher	Springer, Berlin

Languages	English
Product format	Hardback
Released	01.01.1992

EAN	9780306442490
ISBN	978-0-306-44249-0
No. of pages	640
Weight	2760 g
Illustrations	65 SW-Abb.
Series	Advances in X-Ray Analysis
Subject	Natural sciences, medicine, IT, technology > Chemistry > Theoretical chemistry

Customer reviews

No reviews have been written for this item yet. Write the first review and be helpful to other users when they decide on a purchase.