Low-Power Variation-Tolerant Design in Nanometer Silicon

Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations.

List of contents

Introduction and Motivation.- Background on Power Dissipation.- Background on Parameter Variations.- Low power Logic Design under Variations.- Low Power Memory Design under Variations.- System and Architecture Level Design.- Emerging Challenges and Solution Approach.- Conclusion and Discussion.

Summary

Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.

Product details

• Assisted by: Swaru Bhunia (Editor), Swarup Bhunia (Editor), Mukhopadhyay (Editor), Mukhopadhyay (Editor), Saibal Mukhopadhyay (Editor)
• Publisher: Springer, Berlin
• Languages: English
• Product format: Paperback / Softback
• Released: 01.01.2014
• EAN: 9781489981578
• ISBN: 978-1-4899-8157-8
• No. of pages: 440
• Dimensions: 155 mm x 235 mm x 24 mm
• Weight: 694 g
• Illustrations: XV, 440 p.
• Subjects: Humanities, art, music > Art > Interior design, design; Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering; B, Computer-Aided Design (CAD), engineering, Circuits and Systems, reliability, Computer-Aided Engineering (CAD, CAE) and Design, Computer-aided engineering, Electronic circuits, Electronic Circuits and Systems, Nanometer IC Design, Temperature-Aware Design, Manufacturing Process Variation, Reliable IC Design, Process Uncertainty