Description
70
List of contents
Elektronenmikroskopische Untersuchungen an photographischen Schichten.
Product details
| Authors | Eberhard Klein |
| Publisher | Springer, Berlin |
| Languages | German |
| Product format | Paperback / Softback |
| Released | 01.01.1958 |
| EAN | 9783662244999 |
| ISBN | 978-3-662-24499-9 |
| No. of pages | 86 |
| Illustrations | 86 S. 144 Abb. |
| Series |
Mitteilungen aus den Forschungslaboratorien der Agfa-Gevaert AG, Leverkusen-München Mitteilungen aus den Forschungslaboratorien der Agfa-Gevaert AG, Leverkusen-München |
| Subject |
Natural sciences, medicine, IT, technology
> Technology
> Chemical engineering
|
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