Fr. 68.00

OCM 2013 - Optical Characterization of Materials - conference proceedings

German · Paperback / Softback

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Description

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The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.

About the author

Prof. Dr.-Ing. Fernando Puente León lehrt und forscht seit 2008 am Institut für Industrielle Informationstechnik (IIIT) des Karlsruher Instituts für Technologie (KIT). Nach Studium und Promotion arbeitete er bei der Firma DS2 im Bereich der Modem-Entwicklung. Von 2003 bis 2008 war er als Professor für Verteilte Messsysteme an der Technischen Universität München tätig. Seine Forschungsschwerpunkte liegen in der Bild- und Signalverarbeitung, der Mess- und Automatisierungstechnik, der Informationsfusion, der Mustererkennung sowie der Architektur und Analyse verteilter Systeme.

Product details

Authors Jürge Beyerer, Jürgen Beyerer, Thom Längle, Thomas Längle, Fernand Puente León, Fernando Puente León
Assisted by Jürge Beyerer (Editor), Jürgen Beyerer (Editor), Thomas Längle (Editor)
Publisher KIT Scientific Publishing
 
Languages German
Product format Paperback / Softback
Released 01.01.2014
 
EAN 9783866449657
ISBN 978-3-86644-965-7
No. of pages 296
Dimensions 148 mm x 210 mm x 14 mm
Weight 549 g
Illustrations graph. Darst.
Subjects Guides
Natural sciences, medicine, IT, technology > IT, data processing > Miscellaneous

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