Nanoscale Spectroscopy and Its Applications to Semiconductor Research

Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research. This book describes the different approaches to spectrosco- pic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.

List of contents

From the contents:
- Spectroscopy Using an Electron Microscope
- Synchrotron Radiation Nanospectroscopy
- Scanning Probe Spectroscopy

Summary

Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.

Additional text

"This is an unusual collection and the vast audience of workers on semiconductor structure will want to have access to it." (Ultramicroscopy, 99, 2004)

Product details

• Assisted by: Heun (Editor), S Heun (Editor), S. Heun (Editor), G. Salviati (Editor), G Salviati et al (Editor), Y. Watanabe (Editor), N. Yamamoto (Editor)
• Publisher: Springer, Berlin
• Languages: English
• Product format: Hardback
• Released: 01.01.2007
• EAN: 9783540433125
• ISBN: 978-3-540-43312-5
• No. of pages: 308
• Weight: 580 g
• Illustrations: XV, 308 p.
• Series: Lecture Notes in Physics; Lecture Notes in Physics
• Subjects: Natural sciences, medicine, IT, technology > Technology > Mechanical engineering, production engineering; C, Microscopy, spectroscopy, Measurement, Solid State Physics, Spectroscopy and Microscopy, Optical and Electronic Materials, Condensed Matter Physics, Nanotechnology, Physics and Astronomy, Electronic materials, Electronic devices & materials, Optical Materials, Spectrum analysis, spectrochemistry, mass spectrometry, Scientific equipment, experiments & techniques, Scientific standards, measurement etc, Measurement Science and Instrumentation, Physical measurements