Atom Probe Field Ion Microscopy

Zusatztext For the practising analyst there are nine useful appendices including one on specimen preparation! and the book will be invaluable to researchers in the above fields. Informationen zum Autor Hetherington - deceased Klappentext A definitive account of the theory, practice, and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. New applications for this technique are rapidly emerging and graduate level material and surface scientists will enjoy this account of the state-of-the-art. Zusammenfassung A definitive account of the theory, practice, and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. New applications for this technique are rapidly emerging and graduate level material and surface scientists will enjoy this account of the state-of-the-art.

Product details

• Authors: A. Cerezo, Cerezo A., M. G. Hetherington, Hetherington M. G., M. K. Miller, M. K. Cerezo Miller, M.k. Cerezo Miller, Miller M. K., G. D. W. Smith, G. D. W. Smith FRS
• Publisher: Oxford University Press
• Languages: English
• Product format: Hardback
• Released: 01.06.1996
• EAN: 9780198513872
• ISBN: 978-0-19-851387-2
• No. of pages: 520
• Series: Monographs on the Physics and Chemistry of Materials; Monographs on the Physics & Ch; Monographs on the Physics & Ch; Monographs on the Physics and Chemistry of Materials; Monographs on the Physics and
• Subjects: Natural sciences, medicine, IT, technology > Natural sciences (general); Microscopy, SCIENCE / Microscopes & Microscopy, Materials science, TECHNOLOGY & ENGINEERING / Materials Science / General