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Zusatztext This handbook on surface and interface analysis can help to create that knowledgeable person ? sufficient in-depth technical information to satisfy those who want to know the details ? Material scientists! engineers! materials researchers! or anyone who needs information about a material obtained using surface analysis methods will find this handbook an excellent resource for determining the best approach and the right techniques to use.-IEEE Electrical Insulation Magazine! Vol. 26! No. 3! May-June 2010 Informationen zum Autor John C. Riviere, Sverre Myhra Klappentext The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was based on the authors' firm belief that characterization and analysis of surfaces should be conducted in the context of problem solving and not be based on the capabilities of any individual technique. Now, a decade later, trends in science and technology appear to have validated their assertions.Major instrumental assets are generally funded and maintained as central facilities to help potential users make informed decisions about their appropriate use in solving analytical problem(s). Building on the popular first edition, this long-awaited second edition was motivated by the increasingly common industry view that it is more cost-effective to contract out analytical services than to maintain in-house facilities. Guided by that trend, this book focuses on developing strategic thinking for those who decide which facilities to access and where to subcontract analytical work. It covers most of the major tactical issues that are relevant at the location in which data are being produced.New Information in this Second Edition Includes:Electron-optical imaging techniques and associated analytical methodsTechniques based on synchrotron sourcesConvenient and versatile scanning probe group methodsScanning tunneling microscopy, biocompatible materials, and nano-structured materialsAssessing benefits and limitations of different methodologies, this volume provides the essential physical basis and common modes of operation for groups of techniques. Exploring methods for characterization and analysis of particular types of materials and/or their relevant applications-the text synergizes traditional and novel ideas to help readers develop a versatile and rational approach to surface and interface analysis. Zusammenfassung Describes the physical basis and technical implementation of the commonly used techniques for materials characterization. This book features chapters that address surface and interface analysis by HRTEM and XTEM, synchrotron-based techniques, scanning tunneling microscopy, biocompatible materials, and nano-structured materials. Inhaltsverzeichnis Introduction. Elements of Problem-Solving/Materials Characterization. How to Use This Book. Spectroscopic Techniques. Compositional Analysis by AES and XPS. Ion Beam Techniques. In-Depth Analysis. Surface and Interface Analysis by HRTEM and XTEM. Synchrotron-based Techniques. Scanning Force Microscopy. Scanning Tunneling Microscopy. Metallurgy. Minerals, Ceramics, and Glasses. Composites. Corrosion. Tribology. Catalysts. Adhesion. Biocompatible Materials. Nano-structured Materials....
