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Klappentext A 2004 introduction to RHEED for beginners plus detailed experimental and theoretical treatments for experts. Zusammenfassung Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy! since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts. Inhaltsverzeichnis Preface; 1. Introduction; 2. Historical survey; 3. Instrumentation; 4. Wave properties of electrons; 5. The diffraction conditions; 6. Geometrical features of the patterns; 7. Kikuchi and resonance patterns; 8. Real diffraction patterns; 9. Electron scattering by atoms; 10. Kinematic electron diffraction; 11. Fourier components of the crystal potential; 12. Dynamical theory: transfer matrix method; 13. Dynamical theory: embedded R-matrix method; 14. Dynamical theory: integral method; 15. Structural analysis of crystal surfaces; 16. Inelastic scattering in a crystal; 17. Weakly disordered surfaces; 18. Strongly disordered surfaces; 19. RHEED intensity oscillations; Appendix A. Fourier representations; Appendix B. Green's function; Appendix C. Kirchhoff's diffraction theory; Appendix D. A simpler Eigenvalue problem; Appendix E. Waller and Hartree equation; Appendix F. Optimization of dynamical calculation; Appendix G. Scattering factor; References; Index
