Fr. 286.00

Statistical Process Control for Quality Improvement

English · Hardback

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Zusatztext From the first edition:"The book is intellectually stimulating! sometimes on non-statistical issues! which is a rare bonus for readers in this field." - Bulletin of the International Statistical Institute! Short Book Reviews Informationen zum Autor J. Koronacki! J.R. Thompson Klappentext The first edition of this groundbreaking text showed that the Statistical Process Control (SPC) paradigm of W. Edwards Deming was not at all the same as the Quality Control paradigm that has dominated American manufacturing since World War II. Its philosophy of good management! to a great extent responsible for the resurgence and success of Japanese manufacturing efforts! is rooted in a paradigm as process-oriented as physics! yet produces a friendly and fulfilling work environment. This second edition broadens its view to reveal even more of Deming's philosophy and provides more techniques for use at the managerial level. It shows readers that CEOs and service industries need SPC at least as much as production lines! and offers precise methods and guidelines for their use. Zusammenfassung Reveals Deming's philosophy and provides techniques for use at the managerial level. This book shows readers that CEOs and service industries need SPC at least as much as production lines, and offers precise methods and guidelines for their use. Inhaltsverzeichnis PREFACESTATISTICAL PROCESS CONTROL: A BRIEF OVERVIEWQuality Control: Origins! MisperceptionsA Case Study in Statistical Process ControlIf Humans Behaved Like MachinesPareto's MaximDeming's Fourteen PointsQC Misconceptions! East and WestWhite Balls! Black BallsThe Basic Paradigm of Statistical Process ControlBasic Statistical Procedures in Statistical Process ControlAcceptance SamplingThe Case for Understanding VariationStatistical CodaACCEPTANCE-REJECTION STATISTICAL PROCESS CONTROLThe Basic TestBasic Test with Equal Lot SizeTesting with Unequal Lot SizesTesting with Open-Ended Count DataTHE DEVELOPMENT OF MEAN AND STANDARD DEVIATION CONTROL CHARTSA Contaminated Production ProcessEstimation of Parameters of the "Norm" ProcessRobust Estimators for Uncontaminated Process ParametersA Process with Mean DriftA Process with Upward Drift in VarianceCharts for Individual MeasurementsProcess CapabilitySEQUENTIAL APPROACHESThe Sequential Likelihood Ratio TestCUSUM Test for Shift of the MeanShewhart CUSUM ChartPerformance of CUSUM Tests on Data with Mean DriftSequential Tests for Persistent Shift of the MeanCUSUM Performance on Data with Upward Variance DriftAcceptance-Rejection CUSUMSEXPLORATORY TECHNIQUES FOR PRELIMINARY ANALYSISThe Schematic PlotSmoothing by ThreesBootstrappingPareto and Ishikawa DiagramsA Bayesian Pareto Analysis for System Optimization of the Space StationThe Management and Planning ToolsOPTIMIZATION APPROACHESA Simplex Algorithm for OptimizationSelection of Objective FunctionMotivation for Linear ModelsMultivariate ExtensionsLeast SquaresModel "Enrichment"Testing for Model "Enrichment"2p Factorial DesignsSome Rotatable Quadratic DesignsSaturated DesignsA Simulation Based ApproachMULTIVARIATE APPROACHESLikelihood Ratio Tests for LocationCompound and Projection TestsA Robust Estimate of "In Control" LocationA Rank Test for Location SlippageA Rank Test for Change in Scale and/or LocationAPPENDICESA Brief Introduction to Linear AlgebraA Brief Introduction to StochasticsStatistical TablesNote: All chapters also include an introduction! references! and problems. ...

Product details

Authors J. Koronacki, Koronacki J., J.R. Thompson, J.R. (Rice University Thompson, James R. Thompson
Publisher Chapman and Hall Ltd
 
Languages English
Product format Hardback
Released 26.12.2001
 
EAN 9781584882428
ISBN 978-1-58488-242-8
Dimensions 163 mm x 240 mm x 28 mm
Subjects Natural sciences, medicine, IT, technology > Mathematics > General, dictionaries

MATHEMATICS / Applied, Maths for scientists, Maths for engineers

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