Fr. 47.90

C. V. Thompson, C. V. (Massachusetts Institute of Techno Thompson, C. V. Lloyd Thompson, J. R. Lloyd, Lloyd J. R., C. V. Thompson...

Materials Reliability in Microelectronics Ii: Volume 265

English · Paperback / Softback

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Description

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Product details

Authors	C. V. Thompson, C. V. (Massachusetts Institute of Techno Thompson, C. V. Lloyd Thompson
Assisted by	J. R. Lloyd (Editor), Lloyd J. R. (Editor), C. V. Thompson (Editor), Thompson C. V. (Editor)
Publisher	Cambridge University Press ELT

Languages	English
Product format	Paperback / Softback
Released	05.06.2014

EAN	9781107409682
ISBN	978-1-107-40968-2
No. of pages	344
Series	MRS Proceedings MRS Proceedings
Subjects	Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering Materials science, TECHNOLOGY & ENGINEERING / Materials Science / General

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