Handbook of Nanoscopy, 2 Vols.

This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the opticalto the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before goingon to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals,alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided betweenmethods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists andengineers, as well as graduate students and their lecturers.

List of contents

VOLUME 1PREFACETHE PAST, THE PRESENT, AND THE FUTURE OF NANOSCOPYPART I: MethodsTRANSMISSION ELECTRON MICROSCOPYIntroductionThe InstrumentImaging and Diffraction ModesDynamical Diffraction TheoryATOMIC RESOLUTION ELECTRON MICROSCOPYIntroductionPrinciples of Linear Image FormationImaging in the Electron MicroscopeExperimental HREMQuantitative HREMULTRAHIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY AT NEGATIVE SPHERICAL ABERRATIONIntroductionThe Principles of Atomic-Resolution ImagingInversion of the Imaging ProcessCase Study: SrTiO3Practical Examples of Application of NCSI ImagingZ-CONTRAST IMAGINGRecent ProgressIntroduction to the InstrumentImaging in the STEMFuture OutlookELECTRON HOLOGRAPHYImage-Plane Off-Axis Holography Using the Electron BiprismProperties of the Reconstructed WaveHolographic InvestigationsSpecial TechniquesSummaryLORENTZ MICROSCOPY AND ELECTRON HOLOGRAPHY OF MAGNETIC MATERIALSIntroductionLorentz MicroscopyOff-Axis Electron HolographyDiscussion and ConclusionsELECTRON TOMOGRAPHYHistory and BackgroundTheory of TomographyElectron Tomography, Missing Wedge, and Imaging ModesSTEM Tomography and ApplicationsHollow-Cone DF TomographyDiffraction Contrast TomographyElectron Holographic TomographyInelastic Electron TomographyAdvanced Reconstruction TechniquesQuantification and Atomic Resolution TomographySTATISTICAL PARAMETER ESTIMATION THEORY - A TOOL FOR QUANTITATIVE ELECTRON MICROSCOPYIntroductionMethodologyElectron Microscopy ApplicationsConclusionsDYNAMIC TRANSMISSION ELECTRON MICROSCOPYIntroductionTime-Resolved Studies Using ElectronsBuilding a DTEMApplications of DTEMFuture Developments for DTEMConclusionsTRANSMISSION ELECTRON MICROSCOPY AS NANOLABTEM and Measuring the Electrical PropertiesTEM with MEMS-Based HeatersTEM with Gas NanoreactorsTEM with Liquid NanoreactorsTEM and Measuring Optical PropertiesSample Preparation for Nanolab ExperimentsATOMIC-RESOLUTION ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPYIntroductionAtomic-Resolution ETEMDevelopment of Atomic-Resolution ETEMExperimental ProceduresApplications with ExamplesNanoparticles and Catalytic MaterialsOxidesIn situ Atomic Scale Twinning Transformations in Metal CarbidesDynamic Electron Energy Loss SpectroscopyTechnological Benefits of Atomic-Resolution ETEMOther AdvancesReactions in the Liquid PhaseIn situ Studies with Aberration CorrectionExamples and DiscussionApplications to BiofuelsConclusionsSPECKLES IN IMAGES AND DIFFRACTION PATTERNSIntroductionWhat Is Speckle?What Causes Speckle?Diffuse ScatteringFrom Bragg Reflections to SpeckleCoherenceFluctuation Electron MicroscopyVariance versus MeanSpeckle StatisticsPossible Future Directions for Electron Speckle AnalysisCOHERENT ELECTRON DIFFRACTIVE IMAGINGIntroductionCoherent Nanoarea Electron DiffractionThe Noncrystallographic Phase ProblemCoherent Diffractive Imaging of Finite ObjectsPhasing Experimental Diffraction PatternConclusionsSAMPLE PREPARATION TECHNIQUES FOR TRANSMISSION ELECTRON MICROSCOPYIntroductionIndirect Preparation MethodsDirect Preparation MethodsSummarySCANNING PROBE MICROSCOPY - HISTORY, BACKGROUND, AND STATE OF THE ARTIntroductionDetecting Evanescent Waves by Near-Field Microscopy: Scanning Tunneling MicroscopyInteraction of Tip - Sample Electrons Detected by Scanning Near-Field Optical Microscopy and Atomic Force MicroscopyMethods for the Detection of Electric/Electronic Sample PropertiesMethods for the Detection of Electromechanical and Thermoelastic QuantitiesAdvanced SFM/SEM MicroscopySCANNING PROBE MICROSCOPY - FORCES AND CURRENTS IN THE NANOSCALE WORLDIntroductionScanning Probe Microscopy-the Science of Localized ProbesScanning Tunneling Microscopy and Related TechniquesForce-Based SPM MeasurementsVoltage Modulation SPMsCurrent Measurements in SPMEmergent SPM MethodsManipulation of Matter by SPMPerspectivesSCANNING BEAM METHODSScanning MicroscopyConclusionsFUNDAMENTALS OF THE FOCUSED ION BEAM SYSTEMFocused Ion Beam PrinciplesFIB TechniquesVOLUME 2PREFACELOW-ENERGY ELECTRON MICROSCOPYIntroductionTheoretical FoundationsInstrumentationAreas of ApplicationDiscussionConcluding RemarksSPIN-POLARIZED LOW-ENERGY ELECTRON MICROSCOPYIntroductionTheoretical FoundationsInstrumentationAreas of ApplicationDiscussionConcluding RemarksIMAGING SECONDARY ION MASS SPECTROSCOPYFundamentalsSIMS TechniquesBiological SIMSConclusionsSOFT X-RAY IMAGING AND SPECTROMICROSCOPYIntroductionExperimental TechniquesData Analysis MethodsSelected ApplicationsFuture Outlook and SummaryATOM PROBE TOMOGRAPHY: PRINCIPLE AND APPLICATIONSIntroductionBasic PrinciplesField Ion MicroscopyAtom Probe TomographyConclusionSIGNAL AND NOISE MAXIMUM LIKELIHOOD ESTIMATION IN MRIProbability Density Functions in MRISignal Amplitude EstimationNoise Variance EstimationConclusions3-D SURFACE RECONSTRUCTION FROM STEREO SCANNING ELECTRON MICROSCOPY IMAGESIntroductionMatching Stereo ImagesConclusionsPART II: ApplicationsNANOPARTICLESIntroductionImaging NanoparticlesElectron Tomography of NanoparticlesNanoanalytical Characterization of NanoparticlesIn situ TEM Characterization of NanoparticlesNANOWIRES AND NANOTUBESIntroductionStructures of Nanowires and NanotubesDefects in NanowiresIn situ Observation of the Growth Process of Nanowires and NanotubesIn situ Electric Transport Property of Carbon NanotubesIn situ TEM Investigation of Electrochemical Properties of NanowiresSummaryCARBON NANOFORMSImaging Carbon Nanoforms Using Conventional Electron MicroscopyAnalysis of Carbon Nanoforms Using Aberration-Corrected Electron MicroscopesUltrafast Electron MicroscopyScanning Tunneling Microscopy (STM)Scanning Photocurrent Microscopy (SPCM)X-Ray Electrostatic Force Microscopy (X-EFM)Atomic Force MicroscopyScanning Near-Field Optical MicroscopeTip-Enhanced Raman and Confocal MicroscopyTip-Enhanced Photoluminescence MicroscopyFluorescence Quenching MicroscopyFluorescence MicroscopySingle-Shot Extreme Ultraviolet Laser ImagingNanoscale Soft X-Ray ImagingScanning Photoelectron MicroscopyMETALS AND ALLOYSFormation of Nanoscale Deformation Twins by Shockley Partial Dislocation PassageMinimal Strain at Austenite-Martensite Interface in Ti-Ni-PdAtomic Structure of Ni4Ti3 Precipitates in Ni-TiNi-Ti Matrix Deformation and Concentration Gradients in the Vicinity of Ni4Ti3 PrecipitatesElastic Constant Measurements of Ni4Ti3 PrecipitatesNew APB-Like Defect in Ti-Pd Martensite Determined by HRSTEMStrain Effects in Metallic NanobeamsAdiabatic Shear Bands in Ti6Al4VElectron TomographyThe Ultimate ResolutionIN SITU TRANSMISSION ELECTRON MICROSCOPY ON METALSIntroductionIn situ TEM ExperimentsGrain Boundary Dislocation Dynamics MetalsIn situ TEM Tensile ExperimentsIn situ TEM Compression ExperimentsConclusionsSEMICONDUCTORS AND SEMICONDUCTING DEVICESIntroductionNanoscopic Applications on Silicon-Based Semiconductor DevicesConclusionsCOMPLEX OXIDE MATERIALSIntroductionAberration-Corrected Spectrum Imaging in the STEMImaging of Oxygen Lattice Distortions in Perovskites and Oxide Thin Films and InterfacesAtomic-Resolution Effects in the Fine Structure - Further Insights into Oxide Interface PropertiesApplications of Ionic Conductors: Studies of Colossal Ionic Conductivity in Oxide SuperlatticesApplications of Cobaltites: Spin-State Mapping with Atomic ResolutionSummaryAPPLICATION OF TRANSMISSION ELECTRON MICROSCOPY IN THE RESEARCH OF INORGANIC PHOTOVOLTAIC MATERIALSIntroductionExperimentalAtomic Structure and Electronic Properties of c-Si/a-Si:H HeterointerfacesInterfaces and Defects in CdTe Solar CellsInfluences of Oxygen on Interdiffusion at CdS/CdTe HeterojunctionsMicrostructure Evolution of Cu(In,Ga)Se2 Films fromCu Rich to In RichMicrostructure of Surface Layers in Cu(In,Ga)Se2 Thin FilmsChemical Fluctuation-Induced Nanodomains in Cu(In,Ga)Se2 FilmsConclusions and Future DirectionsPOLYMERSForewordA Brief Introduction on Printable Solar CellsMorphology Requirements of Photoactive Layers in PSCsOur Characterization ToolboxHow It All Started: First Morphology StudiesContrast Creation in Purely Carbon-Based BHJ Photoactive LayersNanoscale Volume Information: Electron Tomography of PSCsOne Example of Electron Tomographic Investigation: P3HT/PCBMQuantification of Volume DataOutlook and Concluding RemarksFERROIC AND MULTIFERROIC MATERIALSMultiferroicityFerroic Domain Patterns and Their Microscopical ObservationThe Internal Structure of Domain WallsDomain Structures Related to AmorphizationDynamical Properties of Domain BoundariesConclusionTHREE-DIMENSIONAL IMAGING OF BIOMATERIALS WITH ELECTRON TOMOGRAPHYIntroductionBiological Tomographic TechniquesExamples of Electron Tomography BiomaterialsOutlookSMALL ORGANIC MOLECULES AND HIGHER HOMOLOGSIntroductionOptical MicroscopyScanning Electron Microscopy - SEMAtomic Force and Scanning Tunneling Microscopy (AFM and STM)Transmission Electron Microscopy (TEM)Summary

About the author

Gustaaf Van Tendeloo studied physics and graduated from the University of Antwerp in 1974. He is now a professor at the University of Antwerp (UA) and part time professor at the University of Brussels (VUB). His research focuses on the applications of electron microscopy to different aspects of materials science. He is the author of 700 publications with over 16 000 citations to his work. Professor Van Tendeloo is the head of the electron microscopy group EMAT and director of the "Nano Center of Excellence" of the University. In 2009, he received an ERC
Advanced Grant.

Dirk Van Dyck is professor in physics and honorary vice-rector for research at the University of Antwerp. He graduated from the University of Antwerp in 1976 and spent his career at this University. Professor Van Dyck and has authored over 300 scientific publications in international
journals and was invited speaker at numerous conferences on electron microscopy and image processing. He was one of the co-editors of the Handbook of Microscopy. He received the Honory Franqui Chair of the University of Leuven and holds a Honorary Doctorship of the University of Lima.

Stephen J. Pennycook is a Corporate Fellow in the Materials Science and Technology Division at Oak Ridge National Laboratory and leader of the Scanning Transmission Electron Microscopy Group. He graduated from the University of Cambridge in 1975, moving to Oak Ridge
National Laboratory in 1982. Professor Pennycook has authored over 380 scientific publications in international journals and was invited speaker at over 200 conferences. He is a member of the editorial boards of four journals and a fellow of five professional societies. For his work on Z-contrast microscopy he was awarded the Materials Research Society Medal and the Thomas Young Medal of the Institute of Physics.

Summary

This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical
to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going
on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals,
alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between
methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and
engineers, as well as graduate students and their lecturers.

Report

"Undoubtedly, this is a valuable addition to any material laboratory for motivating researchers/students togain new ideas on using microscopy methods to fundamentally understand their materials and technologies." (Nanomaterials and Energy, 19 February 2013)

Product details

• Authors: Stephen J. Pennycook, Dirk van Dyck, Gustaaf van Tendeloo
• Assisted by: Dirk van Dyck (Editor), Stephen J Pennycook (Editor), Stephen J. Pennycook (Editor), Gustaaf van Tendeloo (Editor), Dirk van Dyck (Editor), Gustaaf van Tendeloo (Editor)
• Publisher: Wiley-VCH
• Languages: English
• Product format: Mixed media product
• Released: 01.04.2012
• EAN: 9783527317066
• ISBN: 978-3-527-31706-6
• No. of pages: 1418
• Dimensions: 176 mm x 244 mm x 70 mm
• Weight: 3044 g
• Illustrations: 739 SW-Abb., 99 Farbabb., 15 Tabellen
• Subjects: Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering; Chemie, Physik, Nanotechnologie, Physikalische Chemie, Werkstoffprüfung, Mikroskopie, Life Sciences, BILDGEBENDES VERFAHREN, Biowissenschaften, Festkörperphysik, chemistry, Physics, Materialwissenschaften, Solid State Physics, Nanotechnology, Materials science, Nanophysics, Physical Chemistry, Imaging systems & technology, Nanomaterialien, Nanomaterials, Electrical & Electronics Engineering, Elektrotechnik u. Elektronik, Allg. Biowissenschaften, Bildgebende Systeme u. Verfahren, Nanophysik, Materials Characterization