Sold out

Angewandte Oberflächenanalyse - Mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektroskopie, XPS Röntgen-Photoelektronen-Spektrometrie

German · Hardback

Description

Product details

Authors Hans J. Dudek, Maria F. Ebel, Manfred Grasserbauer
Publisher Springer, Berlin
 
Languages German
Product format Hardback
Released 01.01.1986
 
EAN 9783540150503
ISBN 978-3-540-15050-3
No. of pages 299
Weight 672 g
Illustrations m. 154 Abb.
Subject Natural sciences, medicine, IT, technology > Chemistry > Theoretical chemistry

Customer reviews

No reviews have been written for this item yet. Write the first review and be helpful to other users when they decide on a purchase.

Write a review

Thumbs up or thumbs down? Write your own review.

For messages to CeDe.ch please use the contact form.

The input fields marked * are obligatory

By submitting this form you agree to our data privacy statement.