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GaP Heteroepitaxy on Si(100) - Benchmarking Surface Signals when Growing GaP on Si in CVD Ambients

English · Hardback

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Description

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Epitaxial integration of III-V semiconductors on silicon substrates has been desired over decades for high application potential in microelectronics, photovoltaics, and beyond. The performance of optoelectronic devices is still severely impaired by critical defect mechanisms driven by the crucial polar-on-nonpolar heterointerface. This thesis reports almost lattice-matched growth of thin gallium phosphide films as a viable model system for III-V/Si(100) interface investigations. The impact of antiphase disorder on the heteroepitaxial growth surface provides quantitative optical in situ access to one of the most notorious defect mechanisms, even in the vapor phase ambient common for compound semiconductor technology. Precise control over the surface structure of the Si(100) substrates prior to III-V nucleation prevents the formation of antiphase domains. The hydrogen-based process ambient enables the preparation of anomalous double-layer step structures on Si(100), highly beneficial for subsequent III-V integration.

List of contents

Introduction.- Experimental.- Si(100) surfaces in chemical vapor environments.- GaP(100) and InP(100) surfaces.- GaP growth on Si(100) and anti-phase disorder.- Conclusion.

About the author

Dr. Henning Döscher
TU Ilmenau
Institut für Physik, FG Photovoltaik
Ehrenbergstr. 29
98693 Ilmenau

Summary

Epitaxial integration of III-V semiconductors on silicon substrates has been desired over decades for high application potential in microelectronics, photovoltaics, and beyond. The performance of optoelectronic devices is still severely impaired by critical defect mechanisms driven by the crucial polar-on-nonpolar heterointerface. This thesis reports almost lattice-matched growth of thin gallium phosphide films as a viable model system for III-V/Si(100) interface investigations. The impact of antiphase disorder on the heteroepitaxial growth surface provides quantitative optical in situ access to one of the most notorious defect mechanisms, even in the vapor phase ambient common for compound semiconductor technology. Precise control over the surface structure of the Si(100) substrates prior to III-V nucleation prevents the formation of antiphase domains. The hydrogen-based process ambient enables the preparation of anomalous double-layer step structures on Si(100), highly beneficial for subsequent III-V integration.

Product details

Authors Henning Döscher
Publisher Springer, Berlin
 
Languages English
Product format Hardback
Released 22.09.2013
 
EAN 9783319028798
ISBN 978-3-31-902879-8
No. of pages 143
Dimensions 164 mm x 240 mm x 16 mm
Weight 356 g
Illustrations XIV, 143 p. 80 illus., 33 illus. in color.
Series Springer Theses
Springer Theses
Subjects Natural sciences, medicine, IT, technology > Physics, astronomy > Atomic physics, nuclear physics

Laser, B, Lasers, Optical and Electronic Materials, Physics and Astronomy, Optical physics, Electronic materials, Electronic devices & materials, Optical Materials, Semiconductors, Photonics, Applied optics, Optics, Lasers, Photonics, Optical Devices

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