Bias Temperature Instability for Devices and Circuits

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

List of contents

Introduction.- Characterization, Experimental Challenges.- Advanced Characterization.- Characterization of Nanoscale Devices.- Statistical Properties/Variability.- Theoretical Understanding.- Possible Defects: Experimental.- Possible Defects: First Principles.- Modeling.- Technological Impact.- Silicon dioxides/SiON.- High-k oxides.- Alternative technologies.- Circuits.

Summary

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

Product details

• Assisted by: Tibo Grasser (Editor), Tibor Grasser (Editor)
• Publisher: Springer, Berlin
• Languages: English
• Product format: Hardback
• Released: 01.01.2014
• EAN: 9781461479086
• ISBN: 978-1-4614-7908-6
• No. of pages: 810
• Dimensions: 159 mm x 36 mm x 248 mm
• Weight: 1477 g
• Illustrations: XI, 810 p. 601 illus., 318 illus. in color.
• Subjects: Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering; B, engineering, quality control, Circuits and Systems, reliability, Electronic devices & materials, Electronics, Microelectronics, Electronics and Microelectronics, Instrumentation, Semiconductors, Industrial safety, Quality Control, Reliability, Safety and Risk, Reliability engineering, Electronics engineering, Electronic circuits, Electronic Circuits and Systems, Security Science and Technology