Fr. 69.00

C. S. Barrett, C.S. Barrett, Charles S. Barrett, Ting C Huang et al, John V. Gilfrich, Ting C. Huang...

Advances in X-Ray Analysis - Volume 35B

English · Paperback / Softback

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Description

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

List of contents

Product details

Assisted by	C. S. Barrett (Editor), C.S. Barrett (Editor), Charles S. Barrett (Editor), Ting C Huang et al (Editor), John V. Gilfrich (Editor), Ting C. Huang (Editor), Ron Jenkins (Editor), G. J. McCarthy (Editor), G.J. McCarthy (Editor), Paul K. Predecki (Editor), R. Ryon (Editor), Deane K. Smith (Editor), Joh V Gilfrich (Editor), John V Gilfrich (Editor)
Publisher	Springer, Berlin

Languages	English
Product format	Paperback / Softback
Released	12.03.2013

EAN	9781461365327
ISBN	978-1-4613-6532-7
No. of pages	641
Dimensions	170 mm x 34 mm x 244 mm
Weight	1101 g
Illustrations	IV, 641 p.
Series	Advances in X-Ray Analysis
Subject	Natural sciences, medicine, IT, technology > Chemistry > Theoretical chemistry

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