Progress in Transmission Electron Microscopy 1 - Concepts and Techniques

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

List of contents

1 The Modern Microscope Today.- 2 The Quest for Ultra-High Resolution.- 3 Z-Contrast Imaging in the Scanning Transmission Electron Microscope.- 4 Inelastic Scattering in Electron Microscopy-Effects, Spectrometry and Imaging.- 5 Quantitative Analysis of High-Resolution Atomic Images.- 6 Electron Crystallography-Structure determination by combining HREM, Crystallographic image processing and electron diffraction.- 7 Electron Amorphography.- 8 Weak-Beam Electron Microscopy.- 9 Point Group and Space Group Identification by Convergent Beam Electron Diffraction.- 10 Advanced Techniques in TEM Specimen Preparation.

Summary

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Product details

• Assisted by: Zhang (Editor), Zhang (Editor), Xiao-Fen Zhang (Editor), Xiao-Feng Zhang (Editor), Ze Zhang (Editor)
• Publisher: Springer, Berlin
• Languages: English
• Product format: Paperback / Softback
• Released: 14.10.2010
• EAN: 9783642087172
• ISBN: 978-3-642-08717-2
• No. of pages: 367
• Dimensions: 156 mm x 20 mm x 234 mm
• Weight: 587 g
• Illustrations: XVI, 367 p.
• Series: Springer Series in Surface Sciences; Springer Series in Surface Sciences
• Subjects: Natural sciences, medicine, IT, technology > Technology > Mechanical engineering, production engineering; C, Chemistry and Materials Science, Measurement, Testing of materials, Nanotechnology, Characterization and Analytical Technique, Materials science, Characterization and Evaluation of Materials, Materials—Surfaces, Surface chemistry & adsorption, Thin films, Surfaces and Interfaces, Thin Films, Surfaces, Interfaces and Thin Film, Scientific standards, measurement etc, Measurement Science and Instrumentation, Physical measurements