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The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.
A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
List of contents
Introduction.- Ellipsometry.- Infrared Model Dielectric Functions.- Polaritons in Semiconductor Layer Structures.- Anisotropic Substrates.- Zinsblende-Structure Materials (III-V).- Wurtzite-Structure Materials (Group-III Nitrides, ZnO).- Magneto-optic Ellipsometry.
About the author
Mathias Schubert, geboren 1976, studierte von 1996 bis 2001 Rechtswissenschaft in Rostock und promovierte dort 2004 mit einer von der Fritz-Thyssen-Stiftung geförderten Arbeit. Nach dem Referendariat in Schleswig-Holstein war er seit 2008 Assistent am Lehrstuhl für öffentliches Recht, insbesondere Verwaltungsrecht sowie Wissenschaftlicher Koordinator des Ostseeinstituts für Seerecht, Umweltrecht und Infrastrukturrecht an der Universität Rostock. Seit der Habilitation im Jahr 2014 ist er dort Privatdozent mit der Lehrbefugnis für öffentliches Recht, Europarecht und Völkerrecht.
Summary
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.
A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.
