Radiation Effects on Embedded Systems

Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today's applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005.
This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.

List of contents

Radiation Space Environment.- Radiation Effects in Microelectronics.- In-flight Anomalies on Electronic Devices.- Multi-level Fault Effects Evaluation.- Effects of Radiation on Analog and Mixed-Signal Circuits.- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing.- Design Hardening Methodologies for ASICs.- Fault Tolerance in Programmable Circuits.- Automatic Tools for Design Hardening.- Test Facilities for SEE and Dose Testing.- Error Rate Prediction of Digital Architectures: Test Methodology and Tools.- Using the SEEM Software for Laser SET Testing and Analysis.

Summary

Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005.
This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.

Product details

• Assisted by: Pasca Fouillat (Editor), Pascal Fouillat (Editor), Ricardo Reis (Editor), Raoul Velazco (Editor)
• Publisher: Springer Netherlands
• Languages: English
• Product format: Paperback / Softback
• Released: 20.10.2010
• EAN: 9789048174171
• ISBN: 978-90-481-7417-1
• No. of pages: 269
• Dimensions: 155 mm x 15 mm x 235 mm
• Weight: 429 g
• Illustrations: VIII, 269 p.
• Subjects: Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering; C, Environmental Health, engineering, Electrical Engineering, Electrical and Electronic Engineering, Circuits and Systems, Electronics, Microelectronics, Electronics and Microelectronics, Instrumentation, Nuclear Energy, Nuclear power & engineering, Electronics engineering, Effects of Radiation/Radiation Protection, Radiation protection, Radiation—Safety measures, Electronic circuits, Electronic Circuits and Systems, Nuclear issues