Modern Diffraction Methods

The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly,the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research.The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of thebook (either graduate students or mature scientists).

List of contents

PREFACEPART I: Structure DeterminationSTRUCTURE DETERMINATION OF SINGLE CRYSTALSIntroductionThe Electron DensityDiffraction and the Phase Problem Fourier Cycling and Difference Fourier Maps Statistical Properties of Diffracted Intensities The Patterson Function Patterson Search Methods Direct Methods Charge Flipping and Low-Density Elimination Outlook and Summary MODERN RIETVELD REFINEMENT, A PRACTICAL GUIDE The Peak Intensity The Peak Position The Peak Profile The Background The Mathematical Procedure Agreement Factors Global Optimization Method of Simulated AnnealingRigid Bodies Introduction of Penalty FunctionsParametric Rietveld Refinement STRUCTURE OF NANOPARTICLES FROM TOTAL SCATTERING Introduction Total Scattering Experiments Structure Modeling and RefinementExamples Outlook PART II: Analysis of the MicrostructureDIFFRACTION-LINE PROFILE ANALYSISIntroductionInstrumental Broadening Structural Specimen Broadening Practical Application of Line Profile AnalysisConclusions RESIDUAL STRESS ANALYSIS BY X-RAY DIFFRACTION METHODS Introduction Principles of Near-Surface X-Ray Residual Stress Analysis Near-Surface X-Ray Residual Stress Analysis by Advanced and Complementary Methods Final RemarksSTRESS ANALYSIS BY NEUTRON DIFFRACTIONIntroductory Remarks Fundamentals of the Technique Instrumentation Capabilities Examples TEXTURE ANALYSIS BY ADVANCED DIFFRACTION METHODS Introduction and Background Synchrotron X-Rays Neutron Diffraction Electron Diffraction Comparison of Methods Conclusions SURFACE-SENSITIVE X-RAY DIFFRACTION METHODS Introduction X-Ray Reflectivity Bragg Scattering in Reduced Dimensions (Crystal Truncation Rod Scattering) Grazing Incidence X-Ray Diffraction Experimental Geometries Trends THE MICRO- AND NANOSTRUCTURE OF IMPERFECT OXIDE EPITAXIAL FILMS The Diffracted Amplitude and IntensityThe Correlation Volume Lattice Strain Example Strain GradientsConclusions PART III: Phase Analysis and Phase TransformationsQUANTITATIVE PHASE ANALYSIS USING THE RIETVELD METHOD Introduction Mathematical Basis Applications in Minerals and Materials Research Summary KINETICS OF PHASE TRANSFORMATIONS AND OF OTHER TIME-DEPENDENT PROCESSES IN SOLIDS ANALYZED BY POWDER DIFFRACTION Introduction Kinetic Concepts Tracing the Process Kinetics by Powder Diffraction Mode of Measurement: In Situ versus Ex Situ Methods Types of Kinetic Processes and Examples Concluding Remarks PART IV: Diffraction Methods and InstrumentationLABORATORY INSTRUMENTATION FOR X-RAY POWDER DIFFRACTION: DEVELOPMENTS AND EXAMPLES Introduction: Historical Sketch Laboratory X-Ray Powder Diffraction: Instrumentation Examples THE CALIBRATION OF LABORATORY X-RAY DIFFRACTION EQUIPMENT USING NIST STANDARD REFERENCE MATERIALSIntroduction The Instrument Profile Function SRMs, Instrumentation, and Data Collection Procedures Data Analysis Methods Instrument Qualification and Validation Conclusions SYNCHROTRON DIFFRACTION: CAPABILITIES, INSTRUMENTATION, AND EXAMPLES Introduction The Underlying Physics of Synchrotron Sources Diffraction Applications Exploiting High Source Brilliance High Q-Resolution Measurements Applications of Tunability: Resonant ScatteringFuture: Ultrafast Science and CoherenceHIGH-ENERGY ELECTRON DIFFRACTION: CAPABILITIES, INSTRUMENTATION, AND EXAMPLES Introduction Instrumentation Electron Diffraction Methods in the TEM Summary and Outlook IN SITU DIFFRACTION MEASUREMENTS: CHALLENGES, INSTRUMENTATION, AND EXAMPLES Introduction Instrumentation and Experimental Challenges Examples INDEX

About the author

Professor Mittemeijer has led the department 'Phase Transformations in Solids' at the Max Planck Institute for Metals Research since 1998. He has published more than 400 papers in international scientific journals and is a member of the editorial board of various journals, among them "International Materials Reviews", "Journal of Alloys and Compounds", "Zeitschrift für Metallkunde" and "Zeitschrift für Kristallographie". He is editor/publisher of the journal "HTM Zeitschrift für Werkstoffe Wärmebehandlung Fertigung" and co-editor of the journal "Current Opinion in Solid State & Materials Science". He acts as referee of numerous journals.

Dr Welzel obtained his PhD in 2002 under the supervision of Professor Mittemeijer and serves now as a research scientist and the head of a service laboratory for X-ray diffraction investigations at the Max Planck Institute for Metals Research. His research activities are dedicated to the diffraction analysis of the microstructure of materials and have a strong methodological interest. He has been an editor of the Proceedings of the European Powder Diffraction Conference since 2002, a special issue of the journal "Zeitschrift für Kristallographie" dedicated to 'The State of the Art of Powder Diffration' and acts as referee of numerous journals.

Summary

The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly,
the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research.

The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the
book (either graduate students or mature scientists).

Report

"It is also well written, covers many topics and conveys significant information. Therefore, it is highly recommended to all researchers in the field either in academia or industry." ( Contemporary Physics , 13 August 2013)

Product details

• Authors: E. J. Mittemeijer, U. Welzel
• Assisted by: J Mittemeijer (Editor), E J Mittemeijer (Editor), E. J. Mittemeijer (Editor), Eric J. Mittemeijer (Editor), Welzel (Editor), Welzel (Editor), U. Welzel (Editor)
• Publisher: Wiley-VCH
• Languages: English, German
• Product format: Hardback
• Released: 01.10.2012
• EAN: 9783527322794
• ISBN: 978-3-527-32279-4
• No. of pages: 528
• Weight: 1190 g
• Illustrations: 245 SW-Abb., 25 Farbabb., 16 Tabellen
• Subjects: Natural sciences, medicine, IT, technology > Chemistry; Chemie, Analytische Chemie, Spektroskopie, chemistry, Wasserchemie, spectroscopy, Analytical Chemistry, Water Chemistry, Chemical and Environmental Health and Safety, Arbeitssicherheit u. Umweltschutz i. d. Chemie, Environmental Analysis, Umweltanalytik, Boden- u. Geochemie, Soil & Geochemistry, Luftanalytik, Air Analysis