Logic Testing and Design for Testability

Klappentext Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Zusammenfassung Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing.

Product details

• Authors: Hideo Fujiwara
• Publisher: The MIT Press
• Languages: English
• Product format: Paperback / Softback
• Released: 31.07.1985
• EAN: 9780262561990
• ISBN: 978-0-262-56199-0
• No. of pages: 304
• Series: Computer Systems Series; MIT Press Classics; Logic Testing and Design for Testability; Computer Systems Series
• Subjects: Guides; Natural sciences, medicine, IT, technology > IT, data processing > General, dictionaries