Optical Imaging and Metrology - Advanced Technologies

A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world s leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.

List of contents

1. LCOS Spatial Light Modulators: Trends and Applications2. Three-dimensional Display and Imaging: Status and Prospects3. Holographic Television: Status and Future4. Display Holography: Status and Future5. Incoherent Computer-generated Holography for 3-D Color Imaging and Display6. Approaches to overcome the Resolution Problem in Incoherent Digital Holography7. Managing Digital Holograms and the Numerical Reconstruction Process for Focus Flexibility8. Three-dimensional Particle Control by Holographic Optical Tweezers9. The Role of Intellectual Property Protection in Creating Business in Optical Metrology10. On the Difference between 3D Imaging and 3D Metrology for Computed Tomography11. Coherence Holography: Principles and Applications12. Quantitative Optical Microscopy at the Nanoscale: New Developments and Comparisons13. Model-based Optical Metrology14. Combination of Direct and Indirect Solution Strategies15. Different Approaches to Overcome Existing Limits in Optical Micro and Nano Metrology16. Interferometry in Harsh Environments17. Advanced Methods for Optical Non-destructive Testing18. Upgrade Holographic Interferometry for Industrial Application by Digital Holography

About the author

Prof Dr. Wolfgang Osten is head of the Institute of Technical Optics.

Summary

A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.

Product details

• Authors: Wolfgang Osten, Nadya Reingand
• Assisted by: Wolfgan Osten (Editor), Wolfgang Osten (Editor), Reingand (Editor), Reingand (Editor), Nadya Reingand (Editor)
• Publisher: Wiley-VCH
• Languages: English
• Product format: Hardback
• Released: 01.08.2012
• EAN: 9783527410644
• ISBN: 978-3-527-41064-4
• No. of pages: 482
• Weight: 1082 g
• Illustrations: 521 SW-Abb., 56 Farbabb., 21 Tabellen
• Subjects: Natural sciences, medicine, IT, technology > Physics, astronomy > Electricity, magnetism, optics; Chemie, Physik, Nanotechnologie, Optik, Mikroskopie, Life Sciences, BILDGEBENDES VERFAHREN, Microscopy, Biowissenschaften, chemistry, Physics, optische Messtechnik, Materialwissenschaften, Nanotechnology, Materials science, Nanophysics, Imaging systems & technology, Nanomaterialien, Nanomaterials, Electrical & Electronics Engineering, Elektrotechnik u. Elektronik, Optische u. Nichtlineare Optische Materialien, Optical and Non-Linear Optical Materials, Bildgebende Systeme u. Verfahren, Nanophysik, Optik u. Photonik, Optics & Photonics, Nanobiotechnologie, Nanobiotechnology, Manipulation von Nanosystemen, Manipulation of Nanosystems, Analysis/Characterization of Nanosystems, Analyse u. Charakterisierung von Nanosystemen, Elektronische Displays, Electrical Engineering - Displays