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Atomic Scale Interconnection Machines - Proceedings of the 1st AtMol European Workshop Singapore 28th-29th June 2011

English · Hardback

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Description

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This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span the subjects of multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements, surface atomic scale mechanical machineries. This state-of-the-art account brings academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.

List of contents

Multi-probe UHV machine instrumentation.- Nano-material nanowires charaterisation.- Surface conductance measurements.- Surface atomic scale machineries (transistor, logic gate, mechanics).- Industrial applications.

About the author

Dr Christian Joachim is First Class Director of Research at the Centre National de la Recherche Scientifique (CNRS), Nanoscience group (GNS) at CEMES/CNRS Toulouse and Adjunct Professor of Nanosciences and Quantum resources at ISAE. He coordinated the EU-sponsored projects: BUN ('Bottom-up Nanomachines') and Pico-Inside and directed 2 NATO Advanced Research Workshops on Nanoscale Sciences in the early 1990s. He is currently in charge of the French Midi-Pyrenees research effort in Nanoscience (CPER Campus G. Dupouy) and of the new European Integrated Project AtMol. He is also A STAR VIP attached to IMRE to develop atomic scale technology in Singapore and WPI in charge of the Toulouse MANA satellite (MEXT Japan).

Summary

This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span the subjects of multi-probe UHV instrumentation, atomic scale nano-material nanowires characterization, atomic scale surface conductance measurements, surface atomic scale mechanical machineries. This state-of-the-art account brings academic researchers and industry engineers access to the tools they need to be at the forefront of the atomic scale technology revolution.

Product details

Assisted by Christia Joachim (Editor), Christian Joachim (Editor)
Publisher Springer, Berlin
 
Languages English
Product format Hardback
Released 17.01.2012
 
EAN 9783642281716
ISBN 978-3-642-28171-6
No. of pages 244
Dimensions 168 mm x 19 mm x 243 mm
Weight 496 g
Illustrations IX, 244 p.
Series Advances in Atom and Single Molecule Machines
Advances in Atom and Single Molecule Machines
Subject Natural sciences, medicine, IT, technology > Physics, astronomy > Atomic physics, nuclear physics

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