Fr. 270.00

Advances in Imaging and Electron Physics

English · Hardback

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Description

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Informationen zum Autor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Klappentext Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. An important feature of these Advances is that the subjects are written in such a way that they can be understood by readers from other specialities. Zusammenfassung Merges "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This title includes articles on the physics of electron devices (especially semiconductor devices)! particle optics at high and low energies! microlithography! image science and digital image processing! and electromagnetic wave propagation. Inhaltsverzeichnis Bontus & Köhler: Reconstruction Algorithms for Computed TomographyBusin, Vandenbroucke & Macaire: Color spaces and image segmentationEasley & Colonna: Generalized discrete Radon transforms and applications to image processing Radlicka: Lie algebraic methods in charged particle opticsRandle: Recent developments in electron backscatter diffraction...

List of contents

Bontus & Köhler: Reconstruction Algorithms for Computed TomographyBusin, Vandenbroucke & Macaire: Color spaces and image segmentationEasley & Colonna: Generalized discrete Radon transforms and applications to image processing Radlicka: Lie algebraic methods in charged particle opticsRandle: Recent developments in electron backscatter diffraction

Product details

Authors Peter Hawkes, Peter W. (EDT) Hawkes
Assisted by Peter W Hawkes (Editor), Peter W. Hawkes (Editor), Peter W. Hawkes (Editor of the series)
Publisher Academic Press London
 
Languages English
Product format Hardback
Released 15.04.2008
 
EAN 9780123742186
ISBN 978-0-12-374218-6
No. of pages 424
Dimensions 152 mm x 235 mm x 25 mm
Series Advances in Imaging & Electron
Advances in Imaging and Electron Physics
Advances in Imaging and Electr
Advances in Imaging and Electron Physics
Advances in Imaging & Electron
Subjects Natural sciences, medicine, IT, technology > Technology > Miscellaneous

TECHNOLOGY & ENGINEERING / Optics, COMPUTERS / Optical Data Processing, Applied optics, Image processing

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