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Informationen zum Autor EDWARD PETERSEN , PhD, worked for the Naval Research Laboratory from 1969 to 1993. Since then, he has served as a consultant. Dr. Petersen's research has focused on estimating upset rates for satellite systems. His work has shown that measurements of space upset rates are consistent with predictions based on laboratory experiments. He has authored or coauthored sixty papers on radiation effects, the majority dealing with single event effects. An IEEE Fellow, Dr. Petersen was the recipient of the IEEE Nuclear and Plasma Sciences Society Radiation Effects Award. Klappentext Enables readers to better understand, calculate, and manage single event effects Single event effects, caused by single ionizing particles that penetrate sensitive nodes within an electronic device, can lead to anything from annoying system responses to catastrophic system failures. As electronic components continue to become smaller and smaller due to advances in miniaturization, electronic components designed for avionics are increasingly susceptible to these single event phenomena. With this book in hand, readers learn the core concepts needed to understand, predict, and manage disruptive and potentially damaging single event effects. Setting the foundation, the book begins with a discussion of the radiation environments in space and in the atmosphere. Next, the book draws together and analyzes some thirty years of findings and best practices reported in the literature, exploring such critical topics as: Design of heavy ion and proton experiments to optimize the data needed for single event predictions Data qualification and analysis, including multiple bit upset and parametric studies of device sensitivity Pros and cons of different approaches to heavy ion, proton, and neutron rate predictions Results of experiments that have tested space predictions Single Event Effects in Aerospace is recommended for engineers who design or fabricate parts, subsystems, or systems used in avionics, missile, or satellite applications. It not only provides them with a current understanding of single event effects, it also enables them to predict single event rates in aerospace environments in order to make needed design adjustments. Zusammenfassung This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. Inhaltsverzeichnis 1. Introduction 1 1.1 Background 1 1.2 Analysis of Single Event Experiments 7 1.2.1 Analysis of Data Integrity and Initial Data Corrections 7 1.2.2 Analysis of Charge Collection Experiments 7 1.2.3 Analysis of Device Characteristics from Cross-Section Data 7 1.2.4 Analysis of Parametric Studies of Device Sensitivity 8 1.3 Modeling Space and Avionics See Rates 8 1.3.1 Modeling the Radiation Environment at the Device 8 1.3.2 Modeling the Charge Collection at the Device 9 1.3.3 Modeling the Electrical Characteristic and Circuit Sensitivity for Upset 9 1.4 Overview of this Book 10 1.5 Scope of this Book 11 2. Foundations of Single Event Analysis and Prediction 13 2.1 Overview of Single Particle Effects 13 2.2 Particle Energy Deposition 15 2.3 Single Event Environments 18 2.3.1 The Solar Wind and the Solar Cycle 19 2.3.2 The Magnetosphere Cosmic Ray and Trapped Particle Motion 22 2.3.3 Galactic Cosmic Rays 24 2.3.4 Protons Trapped by the Earth's Magnetic Fields 42 2.3.5 Solar Events 46 2.3.6 Ionization in the Atmosphere 48 2.4 Charge Collection and Upset 58 2.5 Effective Let 60 2.6 ...
