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The diverse applications of surface plasmons resonance spectroscopy are well know and understood. X-ray spectroscopy has proven to be one of the most useful tools in the study of thin filmm. The lateral electron density variation within a thin film (measured using x-ray spectroscopy) and the dielectric constant variation of the thin film (investigated using surface plasmons resonance spectroscopy) are however linearly related to one onother. It is in the light of the linearity between these two pyzsical quantities that prompted us to combine both spectroscopic analysis processes in one device. In this way it was posible to use the results obtain from x-ray reflectivity and work back to verify the results obtain from the surface plasmons resonance scans. This was realise for static s well as for dynamic processes within a thin film of polymer.
About the author
Felix Ntui Ayuk, geboren 1975 in Kamerun.1980-1991 besuchte er den Baptist High School in Buea, Kamerun. Er Studierte Elektrotechnik an der Fachhochschule Bielefeld und dann Physik an der Universität Siegen. Er wurde mit einer im Rahmen des Graduiertenkollegs entstandenen interdisziplinären Arbeit über Sensorik zur Promotion gefördet.
