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Suchresultat (Frontiers in Electronic Testin)

Leendert M Huisman, Leendert M. Huisman - Data Mining and Diagnosing IC Fails
Leendert M Huisman, Leendert M. Huisman Data Mining and Diagnosing IC Fails Englisch 21.10.2010 Taschenbuch CHF 135.00 6-7 Wochen
Michae Nicolaidis, Michael Nicolaidis - Soft Errors in Modern Electronic Systems
Michae Nicolaidis, Michael Nicolaidis Soft Errors in Modern Electronic Systems Englisch 08.10.2010 Fester Einband CHF 199.00 6-7 Wochen
Hans-Joachi Wunderlich, Hans-Joachim Wunderlich - Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Hans-Joachi Wunderlich, Hans-Joachim Wunderlich Models in Hardware Testing Englisch 09.07.2009 Fester Einband CHF 135.00 6-7 Wochen
Theodore S. Rappaport, Virginia Tech Symposium on Wireless and, Theodore S Rappaport, Theodore S. Rappaport, Jeffrey H Reed, … - Wireless Personal Communications The Evolution of Personal Communications Systems
Theodore S. Rappaport, Virginia Tech Symposium on Wireless and, Theodore S Rappaport, Theodore S. Rappaport, Jeffrey H Reed, … Wireless Personal Communications Englisch 03.03.2011 Fester Einband CHF 159.60 3-5 Wochen
Andre Pavlov, Andrei Pavlov, Manoj Sachdev - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Andre Pavlov, Andrei Pavlov, Manoj Sachdev CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Englisch 29.06.2009 Fester Einband CHF 199.00 6-7 Wochen
Michael G¿ssel, Michael Goessel, Michael Gossel, Michae Gössel, Michael Gössel, … - New Methods of Concurrent Checking
Michael G¿ssel, Michael Goessel, Michael Gossel, Michae Gössel, Michael Gössel, … New Methods of Concurrent Checking Englisch 29.06.2009 Fester Einband CHF 135.00 6-7 Wochen
Wolfgang Kunz, Dominik Stoffel - Reasoning in Boolean Networks Logic Synthesis and Verification Using Testing Techniques
Wolfgang Kunz, Dominik Stoffel Reasoning in Boolean Networks Englisch 01.07.2009 Fester Einband CHF 229.20 3-5 Wochen
Krishnendu Chakrabarty, Anshuman Chandra, Vikra Iyengar, Vikram Iyengar - Test Resource Partitioning for System-on-a-Chip
Krishnendu Chakrabarty, Anshuman Chandra, Vikra Iyengar, Vikram Iyengar Test Resource Partitioning for System-on-a-Chip Englisch 25.06.2009 Fester Einband CHF 135.00 6-7 Wochen
Vishwani Agrawal, Vishwani D. Agrawal, Bushnell, M Bushnell, M. Bushnell, … - Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Vishwani Agrawal, Vishwani D. Agrawal, Bushnell, M Bushnell, M. Bushnell, … Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits Englisch 26.05.2009 Fester Einband CHF 169.00 6-7 Wochen
Osseiran, Adam Osseiran, Ada Osseiran, Adam Osseiran - Analog and Mixed-Signal Boundary-Scan A Guide to the IEEE 1149.4 Test Standard
Osseiran, Adam Osseiran, Ada Osseiran, Adam Osseiran Analog and Mixed-Signal Boundary-Scan Englisch 14.04.2009 Fester Einband CHF 229.20 3-5 Wochen
Francisc da Silva, Francisco da Silva, Teres McLaurin, Teresa McLaurin, Francisco da Silva, … - The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500(TM)
Francisc da Silva, Francisco da Silva, Teres McLaurin, Teresa McLaurin, Francisco da Silva, … The Core Test Wrapper Handbook Englisch 25.08.2006 Fester Einband CHF 189.00 6-7 Wochen
W. Maichen, Wolfgang Maichen - Digital Timing Measurements From Scopes and Probes to Timing and Jitter
W. Maichen, Wolfgang Maichen Digital Timing Measurements Englisch 31.07.2006 Fester Einband CHF 189.00 6-7 Wochen
Luigi Carro, F. L. Kastensmidt, Fernanda Lim Kastensmidt, Fernanda Lima Kastensmidt, Ricardo Reis - Fault-Tolerance Techniques for SRAM-based FPGAs
Luigi Carro, F. L. Kastensmidt, Fernanda Lim Kastensmidt, Fernanda Lima Kastensmidt, Ricardo Reis Fault-Tolerance Techniques for SRAM-based FPGAs Englisch 01.01.2006 Fester Einband CHF 135.00 6-7 Wochen
Alo Barua, Alok Barua, Prithvira Kabisatpathy, Prithviraj Kabisatpathy, Satyab Sinha, … - Fault Diagnosis of Analog Integrated Circuits
Alo Barua, Alok Barua, Prithvira Kabisatpathy, Prithviraj Kabisatpathy, Satyab Sinha, … Fault Diagnosis of Analog Integrated Circuits Englisch 22.09.2005 Fester Einband CHF 135.00 6-7 Wochen