Advances in Imaging and Electron Physics Optics of Charged Particle Analyzers

Informationen zum Autor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Klappentext Advances in Imaging and Electron Physics merges two long-running serials-- Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy . This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Zusammenfassung Features articles on the physics of electron devices (especially semiconductor devices)! particle optics at high and low energies! microlithography! image science and digital image processing! electromagnetic wave propagation! electron microscopy! and the computing methods used in these domains. Inhaltsverzeichnis Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy - A. Sever Skapin Optical interference near surfaces and its application in sub-wavelength microscopy - W. S. Bacsa Introduction of a Quantum of Time (\chronon"), and its Consequences for the Electron in Quantum and Classical Physicsy - Ruy H. A Farias and Erasmo RECAMI Superresolution Imaging - Revisited - Markus E. Testorf Methods and Limitations of Subwavelength Imaging Andrew Neice ...

Produktdetails

• Mitarbeit: Peter W Hawkes (Herausgeber), Peter W. Hawkes (Herausgeber), Peter W. Hawkes (Herausgeber der Reihe)
• Autoren: Peter W. (EDT) Hawkes, Peter W. Hawkes
• Verlag: ELSEVIER SCIENCE BV
• Inhalt: Buch
• Produktform: Fester Einband
• Erscheinungsdatum: 14.09.2010
• Thema: Naturwissenschaften, Medizin, Informatik, Technik > Technik > Elektronik, Elektrotechnik, Nachrichtentechnik
• EAN: 9780123813145
• ISBN: 978-0-12-381314-5
• Anzahl Seiten: 248
• Serie: Advances in Imaging & Electron > 163; Advances in Imaging and Electron Physics; Advances in Imaging and Electr > 163; Advances in Imaging and Electron Physics; Advances in Imaging & Electron > 163
• Themen: SCIENCE / Physics / General; TECHNOLOGY & ENGINEERING / Imaging Systems; Imaging systems & technology; Applied physics; Imaging systems and technology