Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.
The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.
The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

Produktdetails

• Mitarbeit: Battista Biggio (Herausgeber), Luc Rossi (Herausgeber), Marcello Pelillo et al (Herausgeber), Antonio Robles-Kelly (Herausgeber), Luca Rossi (Herausgeber), Andrea Torsello (Herausgeber), Marcello Pelillo (Herausgeber)
• Verlag: Springer, Berlin
• Sprachen: Englisch
• Inhalt: Buch
• Produktform: Taschenbuch
• Erscheinungsdatum: 21.06.2021
• Thema: Naturwissenschaften, Medizin, Informatik, Technik > Informatik, EDV > Informatik
• EAN: 9783030739720
• ISBN: 978-3-0-3073972-0
• Anzahl Seiten: 378
• Illustration: XII, 378 p. 103 illus., 84 illus. in color.
• Abmessung (Verpackung): 15.5 x 2 x 23.5 cm
• Serie: Lecture Notes in Computer Science > 12644; Image Processing, Computer Vision, Pattern Recognition, and Graphics