Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

List of contents

1. Small Angle Scatter with Correlation, Scatter and Intermediate Functions
Jay Theodore Cremer, Jr.


2. Nuclear Scatter of Neutron Spin States
Jay Theodore Cremer, Jr.


3. Atomic-Resolution Core-Level Spectroscopy in the Scanning Transmission Electron Microscope
Christian Dwyer


4. Image Segmentation in the Field of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classification Techniques
Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand Couka and Maxime Carré


5. Point Spread Function Engineering for Super Resolution Single- and Multi- Photon Fluorescence Microscopy
Partha Pratim Mondal and Alberto Diaspro


6. Perspectives on Colour Image Processing by Linear Vector Methods using Projective Geometric Transformations

Stephen J. Sangwine

Product details

• Assisted by: Peter W. Hawkes (Editor), Peter W. Hawkes (Editor of the series)
• Publisher: Elsevier Science & Technology
• Languages: English
• Product format: Hardback
• Released: 18.03.2013
• EAN: 9780124076709
• ISBN: 978-0-12-407670-9
• Dimensions: 152 mm x 20 mm x 229 mm
• Weight: 683 g
• Series: Advances in Imaging and Electron Physics
• Subjects: Natural sciences, medicine, IT, technology > Technology > Electronics, electrical engineering, communications engineering; SCIENCE / Physics / Nuclear, Nuclear physics