Way Kuo nella categoria Libri - Varie

Articoli di Way Kuo in shop completo

Way Kuo come Autore Mostra tutti e 11 i risultati

Wei-Ting Kary Chien, Way Kuo - Reliability and Yield in Nanoelectronics Manufacturing
Wei-Ting Kary Chien, Way Kuo Reliability and Yield in Nanoelectronics Manufacturing Inglese Copertina rigida CHF 255.00 Pubblicazione il 10.09.2026
Kuo, Way Kuo, Way (Texas A&m University) Kuo, Kuo Way - Absence of Soulware in Higher Education
Kuo, Way Kuo, Way (Texas A&m University) Kuo, Kuo Way Absence of Soulware in Higher Education Inglese 01.02.2023 Copertina rigida CHF 176.00 1-3 settimane
Kuo, Way Kuo, Way (Texas A&m University) Kuo, Kuo Way - Absence of Soulware in Higher Education
Kuo, Way Kuo, Way (Texas A&m University) Kuo, Kuo Way Absence of Soulware in Higher Education Inglese Copertina rigida CHF 149.00 Pubblicazione il 01.02.2023
Kuo, W Kuo, Way Kuo, Way (Texas A&m University) Kuo, Kuo Way - Soulware The American Way in China''s Higher Education
Kuo, W Kuo, Way Kuo, Way (Texas A&m University) Kuo, Kuo Way Soulware Inglese 31.12.2018 Copertina rigida CHF 166.00 1-3 settimane
W Kuo, Way Kuo, Way (Texas A&m University) Kuo, Kuo Way - Critical Reflections on Nuclear and Renewable Energy Environmental Protection Safety in Wake of Fukushima Nuclear
W Kuo, Way Kuo, Way (Texas A&m University) Kuo, Kuo Way Critical Reflections on Nuclear and Renewable Energy Inglese 09.05.2014 Copertina rigida CHF 47.50 1-3 settimane
Way Kuo, V. J. Rajendra Prasad, V. Rajendra Prasad, Frank A. Tillman - Optimal Reliability Design Fundamentals and Applications
Way Kuo, V. J. Rajendra Prasad, V. Rajendra Prasad, Frank A. Tillman Optimal Reliability Design Inglese 25.03.2014 Copertina rigida CHF 158.40 2-3 settimane
Wei-Ting Kary Chien, Taeho Kim, Way Kuo, Taeho Kim, Taeho Kim, … - Reliability, Yield, and Stress Burn-In A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Wei-Ting Kary Chien, Taeho Kim, Way Kuo, Taeho Kim, Taeho Kim, … Reliability, Yield, and Stress Burn-In Inglese 01.01.2014 Tascabile CHF 232.80 3-5 settimane
W Kuo, Wa Kuo, Way Kuo, Way (Texas A&m University) Zhu Kuo, Way Zhu Kuo, … - Importance Measures in Reliability, Risk, and Optimization Principles and Applications
W Kuo, Wa Kuo, Way Kuo, Way (Texas A&m University) Zhu Kuo, Way Zhu Kuo, … Importance Measures in Reliability, Risk, and Optimization Inglese 25.05.2012 Copertina rigida CHF 146.00 1-3 settimane
Wei-Ting Kary Chien, Taeho Kim, Way Kuo, Taeho Kim, Taeho Kim, … - Reliability, Yield, and Stress Burn-In A Unified Approach for Microelectronics Systems Manufacturing & Software Development
Wei-Ting Kary Chien, Taeho Kim, Way Kuo, Taeho Kim, Taeho Kim, … Reliability, Yield, and Stress Burn-In Inglese 29.06.2009 Copertina rigida CHF 188.00 1-2 settimane
Hwang Ching-Lai, Way Kuo, Way (Texas a & M University) Prasad Kuo, Way Prasad Kuo, Kuo Way, … - Optimal Reliability Design Fundamentals and Applications
Hwang Ching-Lai, Way Kuo, Way (Texas a & M University) Prasad Kuo, Way Prasad Kuo, Kuo Way, … Optimal Reliability Design Inglese 23.11.2006 Tascabile CHF 86.00 1-3 settimane