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Monte Carlo Modeling for Electron Microscopy and Microanalysis
Oxford Series in Optical & Imaging Sciences No.9

Inglese · Copertina rigida

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Zusatztext `... provides an outstanding introduction for the microscopist seeking to make new use of this powerful simulation tool, as well as a great resource for established modelers looking to extend their knowledge... clearly written and strongly supported by practical examples throughout.' Radiation and Physical Chemistry Klappentext This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature. Zusammenfassung This book is a practical guide to the use of Monte Carlo simulation techniques for the study of electron solid interactions in the electron microscope. Programs, optimized for use on personal computers, are developed to deal with typical applications including secondary, and back- scattered, electron imaging. EBIC imaging of semiconductors and X-ray microanalysis. Inhaltsverzeichnis Preface 1: An Introducton to Monte Carlo Methods 2: Constructing a Simulation 3: The Single Scattering Model 4: The Plural Scattering Model 5: Practical Applications of Monte Carlo Models 6: Backscattered Electrons 7: Charge Collection Microscopy and Cathodoluminescence 8: Secondary Electrons and Imaging 9: X-ray Production and Micro-Analysis 10: What Next in Monte Carlo Simulations? ...

Dettagli sul prodotto

Autori D.c. Joy, David C. Joy
Editore Oxford University Press
 
Contenuto Libro
Forma del prodotto Copertina rigida
Data pubblicazione 15.06.1995
Categoria Scienze naturali, medicina, informatica, tecnica > Fisica, astronomia > Altro
 
EAN 9780195088748
ISBN 978-0-19-508874-8
Numero di pagine 224
Dimensioni (della confezione) 16.3 x 24.2 x 1.8 cm
 
Serie Oxford Series in Optical and Imaging Sciences > 9
Categorie MATHEMATICS / Probability & Statistics / General, Microscopy, SCIENCE / Microscopes & Microscopy, Probability & statistics, Probability and statistics, 3D graphics & modelling, COMPUTERS / Design, Graphics & Media / Graphics Tools, 3D graphics and modelling
 

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