Topics in Electron Diffraction and Microscopy of Materials

Riassunto

Offers an overview of applications for selected electron microscope techniques that have become widespread in their use for furthering our understanding of how materials behave. This work discusses topics including weak-beam techniques for problem solving, defect structures and dislocation interactions, and atomic level imaging applications.

Dettagli sul prodotto

• Con la collaborazione di: Peter. B (Oxford University Hirsch (Editore), Peter. B (University Of Oxford Hirsch (Editore), Peter. B Hirsch (Editore)
• Editore: Taylor and Francis
• Contenuto: Libro
• Forma del prodotto: Copertina rigida
• Data pubblicazione: 01.01.1999
• Categoria: Scienze naturali, medicina, informatica, tecnica > Geoscienze > Mineralogia, petrografia
• EAN: 9780750305389
• ISBN: 978-0-7503-0538-9
• Numero di pagine: 208
• Dimensioni (della confezione): 15.6 x 23.4 cm
• Peso (della confezione): 317 g
• Serie: Series in Microscopy in Materials Science
• Categorie: SCIENCE / Physics / General, Microscopy, SCIENCE / Physics / Crystallography, SCIENCE / Microscopes & Microscopy, Physics, Crystallography, molecular imaging techniques, RHEED for crystal growth, weak-beam imaging, atomic bonding analysis in materials, Dynamical Diffraction Theory, dislocation interactions, valence loss spectroscopy