CHF 370.00

Quantitative Microbeam Analysis
Proceedings of Fortieth Scottish Universities Summer School in

Inglese · Copertina rigida

Spedizione di solito entro 1 a 3 settimane

Descrizione

Ulteriori informazioni

Informationen zum Autor A.G Fitzgerald Klappentext Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions. Zusammenfassung Offers a comprehensive introduction to the field of quantitative microbeam analysis (MQA). This book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions. Inhaltsverzeichnis Quantification in AES and XPS, Surface Analytical Imaging,Electronic Structure and Electron Spectroscopy, Auger Electron Spectroscopy in the STEM, Electron Energy-Loss Spectroscopy-EELS, Light Element Microanalysis and Imaging, A Comparison of Quantification Methods and Analytical Techniques, Data Analysis and Processing, Microscopy and Microanalysis of Insulating Materials, Electron Specimen Interactions, Electron Probe X-ray Microanalysis, Energy Dispersive X-Ray Analysis (EDX) in the TEM/STEM, Analysis and Imaging by Proton-Induced X-Ray Emission (PIXE), Ion-Beam Analytical Techniques-Rutherford Backscattering, Elastic :Recoil and Nuclear Reaction Analysis, Quantitative Analysis of Solids by SIMS and SNMS, Static SIMS, Applications of Surface, Interface and Thin Film Analysis in an Industrial Research Laboratory, Ion-Induced Auger Electron Emission From Solids, Resonance Ionisation Mass Spectrometry (RIMS), Appendix: a list of Acronyms, Contributed papers by students, List of Participants, Index...

Dettagli sul prodotto

Autori A.G Fitzgerald, A.g (University of Dundee Fitzgerald
Con la collaborazione di A.G Fitzgerald (Editore), B.E Storey (Editore), D.J Fabian (Editore)
Editore Taylor & Francis Ltd.
 
Contenuto Libro
Forma del prodotto Copertina rigida
Data pubblicazione 01.01.1993
Categoria Scienze naturali, medicina, informatica, tecnica > Fisica, astronomia > Fisica atomica, fisica nucleare
 
EAN 9780750302562
ISBN 978-0-7503-0256-2
Numero di pagine 350
 
Serie Scottish Graduate Series
Categorie Microscopy
SCIENCE / Physics / Condensed Matter
SCIENCE / Physics / Optics & Light
SCIENCE / Microscopes & Microscopy
Optical physics
 

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