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Juin J. Liou, Krzysztof Iniewski, Juin J. Liou, Liou Juin J. - Electrostatic Discharge Protection
Juin J. Liou, Krzysztof Iniewski, Juin J. Liou, Liou Juin J. Electrostatic Discharge Protection Inglese 31.12.2017 Tascabile Fr. 130.00 1-3 settimane (non disponibile a breve termine)
Andreas Suss, Andreas (Imec Suss, Andreas Suss, Andreas (Imec Suss, Andreas Süss - High Performance Cmos Range Imaging
Andreas Suss, Andreas (Imec Suss, Andreas Suss, Andreas (Imec Suss, Andreas Süss High Performance Cmos Range Imaging Inglese 30.04.2016 Copertina rigida Fr. 266.00 1-3 settimane (non disponibile a breve termine)
Kirsten (Leibniz University Hannover Weide-Zaage, Kirsten Chrzanowska-Jeske Weide-Zaage, Malgorzata Chrzanowska-Jeske, Malgorzata (Portland State University Chrzanowska-Jeske, Chrzanowska-Jeske Malgorzata, Kirsten Weide-Zaage... - Semiconductor Devices in Harsh Conditions
Kirsten (Leibniz University Hannover Weide-Zaage, Kirsten Chrzanowska-Jeske Weide-Zaage, Malgorzata Chrzanowska-Jeske, Malgorzata (Portland State University Chrzanowska-Jeske, Chrzanowska-Jeske Malgorzata, Kirsten Weide-Zaage... Semiconductor Devices in Harsh Conditions Inglese 21.11.2016 Copertina rigida Fr. 190.00 1-3 settimane (non disponibile a breve termine)
Krishnendu (EDT)/ Goel Chakrabarty, Sandeep K. (Tsmc Technology Inc. Goel, Sandeep K. Chakrabarty Goel, Chakrabarty Krishnendu, Krishnendu Chakrabarty, Krishnendu (Duke University Chakrabarty... - Testing for Small-Delay Defects in Nanoscale Cmos Integrated Circuits
Krishnendu (EDT)/ Goel Chakrabarty, Sandeep K. (Tsmc Technology Inc. Goel, Sandeep K. Chakrabarty Goel, Chakrabarty Krishnendu, Krishnendu Chakrabarty, Krishnendu (Duke University Chakrabarty... Testing for Small-Delay Defects in Nanoscale Cmos Integrated Circuits Inglese 25.10.2013 Copertina rigida Fr. 320.00 1-3 settimane (non disponibile a breve termine)
James W M (Swinburne University of Technolog Chon, James W. M Iniewski Chon, James W. M. Chon, James W. M Chon, James W. M. Chon, Kris Iniewski... - Nanoplasmonics
James W M (Swinburne University of Technolog Chon, James W. M Iniewski Chon, James W. M. Chon, James W. M Chon, James W. M. Chon, Kris Iniewski... Nanoplasmonics Inglese 18.10.2013 Copertina rigida Fr. 320.10 1-3 settimane (non disponibile a breve termine)
Hassen (University Grenoble Alpes Fourati, Hassen Belkhiat Fourati, Djamel Eddine Chouaib Belkhiat, Djamel Eddine Chouaib (Universite Ferhat Abbas Setif 1 Belkhiat, Belkhiat Djamel Eddine Chouaib, Hassen Fourati... - Multisensor Attitude Estimation
Hassen (University Grenoble Alpes Fourati, Hassen Belkhiat Fourati, Djamel Eddine Chouaib Belkhiat, Djamel Eddine Chouaib (Universite Ferhat Abbas Setif 1 Belkhiat, Belkhiat Djamel Eddine Chouaib, Hassen Fourati... Multisensor Attitude Estimation Inglese 15.08.2016 Copertina rigida Fr. 376.00 1-3 settimane (non disponibile a breve termine)
Lars T. Berger, Lars T. Schwager Berger, Lars Torsten (EDT)/ Schwager Berger, Andreas (Sony Deutschland Gmbh Schwager, Lars (Breezesolve Torsten Berger, Lars Berger Torsten Berger... - Mimo Power Line Communications
Lars T. Berger, Lars T. Schwager Berger, Lars Torsten (EDT)/ Schwager Berger, Andreas (Sony Deutschland Gmbh Schwager, Lars (Breezesolve Torsten Berger, Lars Berger Torsten Berger... Mimo Power Line Communications Inglese 18.02.2014 Copertina rigida Fr. 320.00 1-3 settimane (non disponibile a breve termine)
Jeffrey L. Hilbert, Jeffrey L. (Wispry Hilbert, Jeffrey L. Hilbert, Jeffrey L. (Wispry Hilbert, Hilbert Jeffrey L. - Tunable Rf Components and Circuits
Jeffrey L. Hilbert, Jeffrey L. (Wispry Hilbert, Jeffrey L. Hilbert, Jeffrey L. (Wispry Hilbert, Hilbert Jeffrey L. Tunable Rf Components and Circuits Inglese 30.11.2015 Copertina rigida Fr. 236.00 1-3 settimane (non disponibile a breve termine)
Juin J. Liou, Juin J. (EDT) Liou, Krzysztof Iniewski, Juin J. Liou, Liou Juin J. - Electrostatic Discharge Protection
Juin J. Liou, Juin J. (EDT) Liou, Krzysztof Iniewski, Juin J. Liou, Liou Juin J. Electrostatic Discharge Protection Inglese 30.09.2015 Copertina rigida Fr. 320.00 1-3 settimane (non disponibile a breve termine)
Angshul Majumdar, Angshul Majumdar, Angshul (EDT)/ Ward Majumdar, Angshul (Indraprastha Institute of Infor Majumdar, Angshul Ward Majumdar, Angshul Majumdar... - Mri
Angshul Majumdar, Angshul Majumdar, Angshul (EDT)/ Ward Majumdar, Angshul (Indraprastha Institute of Infor Majumdar, Angshul Ward Majumdar, Angshul Majumdar... Mri Inglese 31.10.2015 Copertina rigida Fr. 265.00 1-3 settimane (non disponibile a breve termine)
Thomas Noulis, Thomas (Aristotle University of Thessaloni Noulis, Thomas Noulis, Thomas (Aristotle University of Thessaloniki Noulis, Noulis Thomas - Noise Coupling in System-On-Chip
Thomas Noulis, Thomas (Aristotle University of Thessaloni Noulis, Thomas Noulis, Thomas (Aristotle University of Thessaloniki Noulis, Noulis Thomas Noise Coupling in System-On-Chip Inglese 31.01.2018 Copertina rigida Fr. 256.00 1-3 settimane (non disponibile a breve termine)
Mona M. (EDT)/ Mercier Hella, Mona M. Mercier Hella, Mona M. Hella, Mona M. (Rensselaer Polytechnic Institute Hella, Hella Mona M., Krzysztof Iniewski... - Power Management Integrated Circuits
Mona M. (EDT)/ Mercier Hella, Mona M. Mercier Hella, Mona M. Hella, Mona M. (Rensselaer Polytechnic Institute Hella, Hella Mona M., Krzysztof Iniewski... Power Management Integrated Circuits Inglese 31.01.2016 Copertina rigida Fr. 296.00 1-3 settimane (non disponibile a breve termine)
Marta (EDT)/ Gerardin Bagatin, Marta (University of Padova Bagatin, Marta Gerardin Bagatin, Marta Bagatin, Marta (University of Padova Bagatin, Bagatin Marta... - Ionizing Radiation Effects in Electronics
Marta (EDT)/ Gerardin Bagatin, Marta (University of Padova Bagatin, Marta Gerardin Bagatin, Marta Bagatin, Marta (University of Padova Bagatin, Bagatin Marta... Ionizing Radiation Effects in Electronics Inglese 30.11.2015 Copertina rigida Fr. 275.00 1-3 settimane (non disponibile a breve termine)
Farhana (EDT)/ Sousa Sheikh, Farhana (Portland Sheikh, Farhana Sousa Sheikh, Farhana Sheikh, Farhana (Portland Sheikh, Sheikh Farhana... - Circuits and Systems for Security and Privacy
Farhana (EDT)/ Sousa Sheikh, Farhana (Portland Sheikh, Farhana Sousa Sheikh, Farhana Sheikh, Farhana (Portland Sheikh, Sheikh Farhana... Circuits and Systems for Security and Privacy Inglese 24.05.2016 Copertina rigida Fr. 295.00 1-3 settimane (non disponibile a breve termine)
Farrell, Ellen L. Holthoff, Paul M. Pellegrino, Paul M. (United States Army Research L Pellegrino, Paul M. Holthoff Pellegrino, Mikella E. Farrell... - Laser-Based Optical Detection of Explosives
Farrell, Ellen L. Holthoff, Paul M. Pellegrino, Paul M. (United States Army Research L Pellegrino, Paul M. Holthoff Pellegrino, Mikella E. Farrell... Laser-Based Optical Detection of Explosives Inglese 31.12.2017 Tascabile Fr. 150.00 3-5 settimane
Iannone Eugenio, Eugenio Iannone, Eugenio (Dianax S.r.l. Ceo and Founder Iannone, Iannone Eugenio - Telecommunication Networks
Iannone Eugenio, Eugenio Iannone, Eugenio (Dianax S.r.l. Ceo and Founder Iannone, Iannone Eugenio Telecommunication Networks Inglese 14.12.2011 Copertina rigida Fr. 320.00 1-3 settimane (non disponibile a breve termine)
Iannone Eugenio, Eugenio Iannone, Eugenio (Dianax S.r.l. Ceo and Founder Iannone, Iannone Eugenio - Telecommunication Networks
Iannone Eugenio, Eugenio Iannone, Eugenio (Dianax S.r.l. Ceo and Founder Iannone, Iannone Eugenio Telecommunication Networks Inglese 31.12.2018 Tascabile Fr. 136.00 1-3 settimane (non disponibile a breve termine)
Rivetti, Angelo Rivetti, Angelo (Istituto Nazionale di Fisica Nucleare Rivetti, Rivetti Angelo - Cmos, Front End Electronics for Rad
Rivetti, Angelo Rivetti, Angelo (Istituto Nazionale di Fisica Nucleare Rivetti, Rivetti Angelo Cmos, Front End Electronics for Rad Inglese 31.12.2017 Tascabile Fr. 160.00 3-5 settimane
Krzysztof (EDT) Iniewski, Krzysztof Iniewski - Optical, Acoustic, Magnetic, and Mechanical Sensor Technologies
Krzysztof (EDT) Iniewski, Krzysztof Iniewski Optical, Acoustic, Magnetic, and Mechanical Sensor Technologies Inglese 29.02.2012 Copertina rigida Fr. 320.00 3-5 settimane
Jean-Luc Autran, Jean-Luc (Aixmarseille University Autran, Jean-Luc (Aix-Marseille University Autran, Jean-Luc Munteanu Autran, Autran Jean-Luc, Daniela Munteanu... - Soft Errors
Jean-Luc Autran, Jean-Luc (Aixmarseille University Autran, Jean-Luc (Aix-Marseille University Autran, Jean-Luc Munteanu Autran, Autran Jean-Luc, Daniela Munteanu... Soft Errors Inglese 25.02.2015 Copertina rigida Fr. 250.00 3-5 settimane