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This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.
About the author
Prof. Gunturi Venkata Sitarama Sastry is former Professor, Department of Metallurgical Engineering and also Dean of Academic Affairs, IIT(BHU), Varanasi, India for a three year period. He began extensive use of transmission electron microscopy since his doctoral work on rapidly quenched aluminum alloys at IT-BHU, Varanasi. His research tools have been diverse microstructural characterization techniques with major emphasis on TEM. Most of his publications in high impact international Journals re¿ect this vast expertise in the ¿eld. Several of his students bene¿ted from his courses on metallographic techniques taught at the Department of Metallurgical Engineering, IIT(BHU), Varanasi, India (formerly Institute of Technology, BHU). He also conducted many short-term courses on electron microscopy and associated techniques at various institutions and research laboratories. He headed the National Electron Microscopy Facility established at the Department for over ¿ve years and later worked for the augmentation of new facilities over there. The Electron Microscope Society of India recognized his contributions to the ¿eld by bestowing upon him the 'Lifetime Achievement Award 2017'.
