Practical Electron Microscopy Of Lattice Defects

This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.

Product details

• Authors: Hiroyasu Saka, Hiroyasu Saka, Saka Hiroyasu
• Publisher: Ingram Publishers Services
• Languages: English
• Product format: Hardback
• Released: 31.05.2021
• EAN: 9789811234699
• ISBN: 978-981-1234-69-9
• Subjects: Natural sciences, medicine, IT, technology > Physics, astronomy > Miscellaneous; SCIENCE / Scientific Instruments, SCIENCE / Laboratory Techniques, Scientific equipment, experiments & techniques, Scientific equipment, experiments and techniques