CHF 239.00

Ultrathin Metal Films
Magnetic and Structural Properties

English · Paperback / Softback

Shipping usually within 6 to 7 weeks

Description

Read more

Ultrathin metal films have great potential for applications in areas such as magnetic sensors, recording materials, and novel devices such as spin filters or transistors. This research monograph discusses the close correlation between the magnetic and structural properties of thin films in the context of numerous examples of epitaxial metal films, while emphasis is laid on the stabilization of novel structures compared to the bulk material. Further options, possibilities, and limits for applications are given. Techniques for the characterization of thin films are addressed as well.

About the author

Matthias Wuttig is Professor for Physics of New Materials at the University of Aachen since 1997, and holds a JARA Professorship at Research Centre Jülich & RWTH Aachen since 2011. He served as Dean of the Faculty of Mathematics, Informatics and Natural Sciences, and is Speaker of the strategy board of RWTH Aachen. He has been visiting professor in China, Kenya, USA, and Singapure. His research on phase change memories and organic thin films has been awarded several times, among others with the Heinz-Maier-Leibnitz Prize of the Ministry for Education and Science, the Gaede-Prize of the German Vacuum Society, and the Stanford R. Ovshinsky Prize. Since 2009, Matthias Wuttig is Einstein Professor at the Chinese Academy of Sciences.

Summary

Ultrathin metal films have great potential for applications in areas such as magnetic sensors, recording materials, and novel devices such as spin filters or transistors. This research monograph discusses the close correlation between the magnetic and structural properties of thin films in the context of numerous examples of epitaxial metal films, while emphasis is laid on the stabilization of novel structures compared to the bulk material. Further options, possibilities, and limits for applications are given. Techniques for the characterization of thin films are addressed as well.

Customer reviews

No reviews have been written for this item yet. Write the first review and be helpful to other users when they decide on a purchase.

Write a review

Thumbs up or thumbs down? Write your own review.

For messages to CeDe.ch please use the contact form.

The input fields marked * are obligatory

By submitting this form you agree to our data privacy statement.