Fr. 79.00

Investigation of Electrical Properties of(p-n) Junction Porous Silicon

Inglese, Tedesco · Tascabile

Spedizione di solito entro 2 a 3 settimane (il titolo viene stampato sull'ordine)

Descrizione

Ulteriori informazioni

Chapter one presents a brief introduction and enunciates the objectives of our investigations also presents a review of the physics of semiconductor nanostructures. chapter two gives details of the etching process,the techniques employed to porous silicon nanostructures,chapter three describes instruments and devices employed in this work.chapter four we have presented the results and discussions of the surface morphology of the reconstructed surfaces etched by photo-electro chemical etching including details The morphological aspects like: pore width, pore shape and wall thickness between two pores of the prepared porous silicon for the abrupt (p-n) junction samples have been studied by using scanning electron microscopy (SEM). These characteristics are strongly dependent on the preparation conditions and the results with discussion of the electrical properties like, current-voltage characteristics and capacitance-voltage characteristics and other studies for sandwich structures, (Al/p-n junction PSi/Al) at room temperature.

Info autore










Muna S. Mohammed Jawad was born in Baghdad in 1980, She received B.Sc. and M.Sc. degree in Laser physics From Applied Science, University of Technology, Baghdad, Iraq in 2002 and 2013. She is now Assist Lect. Employed in University of Technology.

Dettagli sul prodotto

Autori Naser Mah Ahmed, Naser Mahmoud Ahmed, Alwa Mohammed Alwan, Alwan Mohammed Alwan, Mun Salih, Muna Salih
Editore LAP Lambert Academic Publishing
 
Lingue Inglese, Tedesco
Formato Tascabile
Pubblicazione 01.01.2013
 
EAN 9783659408687
ISBN 978-3-659-40868-7
Pagine 140
Categoria Scienze naturali, medicina, informatica, tecnica > Chimica > Chimica fisica

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