Fr. 294.40

Principles of Electron Optics, Volume 4 - Advanced Wave Optics

English · Paperback / Softback

Shipping usually within 4 to 7 working days

Description

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Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schroedinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration - the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more.

List of contents










Part XIV Electron¿specimen Interactions 69. Electron Interactions in Thin Specimens
Part XV Digital Image Processing 70. Introduction 71. Acquisition, Sampling and Coding 72. Enhancement 73. Linear Restoration 74. Nonlinear Restoration ¿ the Phase Problem 75. Three-dimensional Reconstruction 76. Image Analysis 77. Instrument Control and Instrumental Image Manipulation
Part XVI Coherence, Brightness and Spectral Functions 78. Coherence and the Brightness Functions 79. Wigner Optics
Part XVII Vortex Studies, the Quantum Electron Microscope 80. Orbital Angular Momentum, Vortex Beams and the Quantum Electron Microscope


About the author










Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 ¿ 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

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