Fr. 229.20

Dna Damage Recognition

English · Paperback / Softback

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Description

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Covering an array of topics, this authoritative work summarizes recent developments, while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways. Richly illustrated, this guide discusses the theoretical aspects of DNA damage recognition, exploring those that are relevant for various regulatory responses, such as transcriptional regulation or checkpoint arrest. It also details key concepts in the recognition of bulky DNA base damage, reviews the excision repair of non-bulky base damage, covers short-patch repair and the recognition and repair of single- and double-strand breaks.

List of contents

Mechanisms of Damage Recognition: Theoretical Considerations. UV Damage and Other Bulky DNA-adducts. Non-bulky Base Damage. Mismatch Repair. Replicational Bypass of DNA Lesions. DNA Strand Breaks. Perception of DNA Damage for Initiating Regulatory Responses

About the author

Wolfram Siede, Yoke Wah Kow, Paul W. Doetsch

Summary

Stands as the most comprehensive guide to the subject—covering every essential topic related to DNA damage identification and repair.
Covering a wide array of topics from bacteria to human cells, this book summarizes recent developments in DNA damage repair and recognition while providing timely reviews on the molecular mechanisms employed by cells to distinguish between damaged and undamaged sites and stimulate the appropriate repair pathways.
about the editors...
WOLFRAM SIEDE is Associate Professor, Department of Cell Biology and Genetics, University of North Texas Health Science Center, Fort Worth. He received the Ph.D. degree (1986) from Johann Wolfgang Goethe University, Frankfurt Germany.
YOKE WAH KOW is Professor, Department of Radiation Oncology, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1981) from Brandeis University, Waltham, Massachusetts.
PAUL W. DOETSCH is Professor, Departments of Biochemistry, Radiation Oncology, and Hematology and Oncology, and Associate Director for Basic Research, Winship Cancer Institute, Emory University School of Medicine, Atlanta, Georgia. He received the Ph.D. degree (1982) from Temple University School of Medicine, Philadelphia, Pennsylvania.

Product details

Authors Wolfram Doetsch Siede
Assisted by Paul W Doetsch (Editor), Paul W. Doetsch (Editor), Wolfram Siede (Editor)
Publisher Taylor & Francis Ltd.
 
Languages English
Product format Paperback / Softback
Released 31.08.2019
 
EAN 9780367392130
ISBN 978-0-367-39213-0
No. of pages 896
Subject Natural sciences, medicine, IT, technology > Medicine > Clinical medicine

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