Advanced Materials Characterization - Basic Principles, Novel Applications, and Future Directions

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

Inhaltsverzeichnis

1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Nanomechanical system 4. X-Ray photo spectroscopy (XPS) 5. Scanning electron microscope (SEM) 6. Field emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force Microscope (AFM) 9. Near-field scanning optical microscope Raman 10. Optical characterization instruments 11. Synchrotron techniques 12. Other advanced instruments used for characterization of functionally graded materials

Zusammenfassung

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

Produktdetails

• Autoren: Ram Krishna, Krishna Ram, Ch Sateesh Kumar, Ch Sateesh (University of Johannesburg Kumar, M. Muralidhar Singh
• Verlag: Taylor & Francis Ltd.
• Sprache: Englisch
• Produktform: Taschenbuch
• Erschienen: 29.11.2024
• EAN: 9781032375113
• ISBN: 978-1-0-3237511-3
• Seiten: 130
• Serie: Advanced Materials Processing and Manufacturing
• Themen: Naturwissenschaften, Medizin, Informatik, Technik > Technik > Chemische Technik; SCIENCE / Chemistry / Analytic, TECHNOLOGY & ENGINEERING / Engineering (General), Spectrum analysis, spectrochemistry, mass spectrometry, Instruments & instrumentation engineering, Instruments and instrumentation